Semiconductor nanowire sensors I. G. Neizvestny Micro- and Nanoelectronic Devices 19 July 2009 Pages: 223 - 238
Dual-collector bipolar magnetotransistor: Defining and determining its magnetic-field sensitivity R. D. Tikhonov Micro- and Nanoelectronic Devices 19 July 2009 Pages: 239 - 250
Dependence of the transversal magneto-optic Kerr effect on the incidence angle of light for ultrathin films of cobalt and Co/Cu/Co multilayers V. V. NaumovV. A. PaporkovM. V. Lokhankin Micro- and Nanostructure Characterization 19 July 2009 Pages: 251 - 256
An automated stand for express-diagnostics of magnetoresistive structures O. S. TrushinD. A. KokanovE. Yu. Buchin Micro- and Nanostructure Characterization 19 July 2009 Pages: 257 - 259
Simulating the exposure of ICs to voltage surges caused by nuclear explosions K. A. EpifantsevO. A. GerasimchukP. K. Skorobogatov Device and Structure Modeling and Simulation 19 July 2009 Pages: 260 - 272
The accuracy and validity of the simulation of VLSI MOS transistors V. V. Denisenko Device and Structure Modeling and Simulation 19 July 2009 Pages: 273 - 278
Calculation of the concentration profile of copper in the TiN/CoSi2/Si system during thermal heating V. I. RudakovV. N. Gusev Computational Electrochemistry 19 July 2009 Pages: 279 - 284
Constraint graph used to minimize on-chip wiring area with regard to electromigration and conductor voltage drop A. S. Plekhanov Circuit Analysis and Synthesis 19 July 2009 Pages: 285 - 287