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Russian Microelectronics

, Volume 38, Issue 4, pp 251–256 | Cite as

Dependence of the transversal magneto-optic Kerr effect on the incidence angle of light for ultrathin films of cobalt and Co/Cu/Co multilayers

  • V. V. Naumov
  • V. A. Paporkov
  • M. V. LokhankinEmail author
Micro- and Nanostructure Characterization
  • 89 Downloads

Abstract

The transversal magneto-optic Kerr effect in thin cobalt films and Co/Cu/Co structures obtained by magnetron sputtering in the magnetic field is investigated. It is shown that the dependences of the TMOKE and reflection intensity on the incidence angle of light substantially vary upon varying the thickness of the cobalt layer from 6 to 0.7 nm. The theoretical evaluation of the obtained data in the context of the classic theory of propagation of light in the conducting medium is presented

PACS

68.37.-d 

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Copyright information

© Pleiades Publishing, Ltd. 2009

Authors and Affiliations

  • V. V. Naumov
    • 1
  • V. A. Paporkov
    • 2
  • M. V. Lokhankin
    • 2
    Email author
  1. 1.Yaroslavl Branch, Physicotechnological InstituteRussian Academy of SciencesYaroslavlRussia
  2. 2.Yaroslavl State UniversityYaroslavlRussia

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