Probability method for evaluating measurement errors with the distribution of the measured quantity taken into consideration V. I. Sobolev OriginalPaper Pages: 791 - 794
Taking into consideration gradual failures of switching elements with tunnel diodes L. V. GolovinskiiE. M. Sheremet OriginalPaper Pages: 795 - 797
Samples for the calibration and testing of radioisotope thickness gauges M. G. BoguslavskiiE. E. Sharova OriginalPaper Pages: 798 - 800
Selection of an operating frequency in screening-method measurements V. F. AvduevskiiV. A. Solntsev OriginalPaper Pages: 801 - 803
Instruments for testing threads with circulating balls B. L. SmolenskiiM. A. Rokhlenko OriginalPaper Pages: 804 - 805
Production method for testing the relative position of nominally coaxial holes A. G. Stepenyan OriginalPaper Pages: 806 - 809
Raising the precision of the piezoelectric method for measuring force N. Kh. NeparidzeE. D. NovgorodovK. T. Troinikov OriginalPaper Pages: 810 - 812
Thermoelectric stability of thermocouples made of high-melting metals or their alloys G. B. LappD. I. Popova OriginalPaper Pages: 816 - 817
Errors in individual calibrations of chromel-copel thermocouples B. K. BraginN. G. Pupysheva OriginalPaper Pages: 818 - 819
Method for measuring the thermoelectric characteristics of semiconductors in the solid and liquid phases at high temperatures O. P. AstakhovV. V. Lobankov OriginalPaper Pages: 820 - 822
Errors in approximating nonuniform scales K. B. KarandeevF. B. Grinevich OriginalPaper Pages: 823 - 826
Utilization of electrets in built-in control circuits L. L. BarvinskiiV. S. Dem'yanchuk OriginalPaper Pages: 827 - 828
Mutual effect of elements in a three-phase, two-element wattmeter A. M. Lyubarskaya OriginalPaper Pages: 829 - 833
Methods for testing two-element, three-phase, high-precision wattmeters A. M. Ilyukovich OriginalPaper Pages: 834 - 836
Harmonic analysis of infrasonic electrical signals and graphic curves A. I. Naidenov OriginalPaper Pages: 837 - 840
Device for measuring hysteresis loop coefficients V. V. KlimovYa. V. KovalinN. A. Netsvetailov OriginalPaper Pages: 845 - 847
Thermistor bridge with an automatic digital display and zero correction L. M. ZaksE. N. BelikovV. M. Petrov OriginalPaper Pages: 848 - 851
Wide-band automatic wavemeter in the centimeter range G. I. GladyshevV. M. Chemeris OriginalPaper Pages: 857 - 859
Statistical method for establishing intervals between tests A. S. NemirovskiiV. V. Nikonov OriginalPaper Pages: 861 - 863
Technique of computing deadlines for compulsory measuring-instrument testing V. D. Kudritskii OriginalPaper Pages: 864 - 866
Periodicity of departmental inspection of measuring instruments I. M. Fedorov OriginalPaper Pages: 867 - 868
53rd session of the International Committee of Weights and Measures G. D. Burdun Information Pages: 869 - 872
All-union conference of higher educational institutions on methods for measuring flows of liquids, gases, and loose materials I. N. KraevYu. B. Volynskii Information Pages: 873 - 873
Instruments for testing the diameter of raceways B. Ya. Rubenchik Brief Reports and Letters to the Editorial Board Pages: 874 - 875
Testing automobile scales S. M. Ageev Brief Reports and Letters to the Editorial Board Pages: 876 - 877
Spring strain-gauge deflectometer V. A. ApanasovP. M. Sherdakov Brief Reports and Letters to the Editorial Board Pages: 878 - 878
Errors in measuring color temperatures L. A. Boyarskii Brief Reports and Letters to the Editorial Board Pages: 879 - 880
Rotating equipment for calibrating thermoanemometers Yu. V. Karbe Brief Reports and Letters to the Editorial Board Pages: 881 - 882
Utilization of photomultipliers, type F-12, for raising the sensitivity of galvanometers B. K. Vasilenko Brief Reports and Letters to the Editorial Board Pages: 883 - 883
Temperature compensation circuit for an ac voltage stabilizer with silicon stabilitrons A. I. GladskiiV. Ya. KirseiV. A. Reshedko Brief Reports and Letters to the Editorial Board Pages: 884 - 884
Selection of optimum parameters for frequency correction elements in a device with an inductive input impedance V. R. Kheinrikhsen Brief Reports and Letters to the Editorial Board Pages: 885 - 886
