Conclusions
-
1.
Boundary tests serve to obtain discrete circuits which are not critical to variations of the parameters of their components over a wide range ±(30–50)%, so that the circuit reliability is determined in the main by sudden failures. The computation of the reliability of such circuits is reduced to evaluating their reliability with respect to sudden failures.
-
2.
The reliability of a discrete system is evaluated by that of its circuit and inputs, for whose interrelation logical equations are derived.
-
3.
The above switching circuit, which consists of a tunnel diode with a transistor, is characterized by high reliability and small sensitivity to variations in the parameters of its components, and it can be recommended for practical application in pulse and measurement technology.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
Literature cited
V. I. Fistul (editor), Collection of Articles: Tunnel Diodes [Russian translation] (IL, 1961).
V. P. Gusev, A. V. Fomin, G. M. Kunyavskii, et al., Computation of Electrical Tolerances of Radio-Electronic Equipment [in Russian] (“Sovetskoe radio,” Moscow, 1963).
K. S. Rzhevkin, Tunnel Diodes [in Russian] (Gosénergoizdat, Moscow, 1962).
Rights and permissions
About this article
Cite this article
Golovinskii, L.V., Sheremet, E.M. Taking into consideration gradual failures of switching elements with tunnel diodes. Meas Tech 8, 795–797 (1965). https://doi.org/10.1007/BF00981531
Issue Date:
DOI: https://doi.org/10.1007/BF00981531