1. A central limit theorem for linear estimators of measurement results

   • E. V. Eremin

   General Problems of Metrology and Measurement Technology Pages: 1009 - 1016

2. Bayes method for complex processing of information in gravitational wave experiment

   • A. V. Gusev
   • V. K. Milyukov
   • V. N. Rudenko

   General Problems of Metrology and Measurement Technology Pages: 1017 - 1020

3. Method for detecting and rectifying modular errors in devices for storing and transmitting information in measurement technology microprocessors

   • Aleksandr A. Pavlov
   • A. A. Pavlov

   General Problems of Metrology and Measurement Technology Pages: 1021 - 1027

4. Relative information about reliability and methods of obtaining it

   • N. N. Radaev
   • M. V. Sakharov

   General Problems of Metrology and Measurement Technology Pages: 1028 - 1032

5. Simple algorithm for determining low-frequency fluctuation components of the frequency of a self-oscillator

   • N. V. Gerasimova
   • M. N. Kulikov

   General Problems of Metrology and Measurement Technology Pages: 1033 - 1036

6. Analysis of the ellipse of polarization by the senarmont method as the phase difference varies in the range 0–2π

   • V. I. Chmyrev
   • V. M. Skorikov

   Opticophysical Measurements Pages: 1037 - 1042

7. Digital recording and analysis of optical-polarization images of a domain structure

   • R. M. Grechishkin
   • O. V. Malyshkina
   • S. S. Soshin

   Opticophysical Measurements Pages: 1043 - 1046

8. Measurement of small amplitudes of vibration with a laser vibrometer

   • V. G. Atavin
   • Yu. V. Khudyakov
   • E. F. Yurchik

   Mechanical Measurements Pages: 1047 - 1050

9. The effect of matched pairs of thermometers on the error in determining thermal energy using a commercial metering unit

   • Yu. V. Tarbeev
   • P. V. Novitskii
   • A. G. Lupei

   Thermal Measurements Pages: 1051 - 1056

10. The metrological characteristics of automated magnetic measuring systems

    • V. V. Krokhin

    Electromagnetic Measurements Pages: 1057 - 1061

11. Wavelet and fourier analysis of electric fluctuations in semiconductor and electrochemical systems

    • E. Yu. Budnikov
    • I. Yu. Kuboev
    • A. M. Gulyaev

    Electromagnetic Measurements Pages: 1062 - 1067

12. Improving the accuracy of experimental prediction of the detectability of nonlinear objects by radar

    • V. V. Belyaev
    • A. T. Mayunov
    • S. N. Razin'kov

    Radio Engineering Measurements Pages: 1068 - 1074

13. Modification of the comparison method for the moving-source calibration of hydrophones in a shallow sea

    • A. V. Agranovskii
    • G. N. Korol'kov
    • V. A. Sborshchikov

    Acoustical Measurements Pages: 1075 - 1079

14. Dependence of the probability of detecting a moving source of ionizing radiation on various parameters

    • V. M. Kirillov
    • E. A. Korolenko
    • A. A. Neklyudov

    Measurements of Ionizing Radiations Pages: 1080 - 1083

15. Basic characteristics of a new type of reference electrode for pH measurements

    • N. N. Zdorikov
    • O. V. Karpov
    • A. V. Shavykin

    Physicochemical Measurements Pages: 1084 - 1089

16. New regulations concerning the issue and use of reference materials

    • N. G. Semenko

    Physicochemical Measurements Pages: 1090 - 1093

17. Support from regulations on the development of reference materials for the compositions of pure organic substances

    • I. E. Dobrovinskii
    • I. A. Piterskikh

    Physicochemical Measurements Pages: 1094 - 1096

18. Chemical changes in powder reference materials examined by accelerated ageing methods

    • D. G. Lisienko
    • N. V. Ul'yanova

    Physicochemical Measurements Pages: 1097 - 1101

19. Approval procedure for using foreign reference materials

    • I. E. Dobrovinskii
    • N. G. Semenko
    • É. G. Burykina

    Physicochemical Measurements Pages: 1102 - 1104

20. Stages in improving the metrological support to ultrasonic thickness gauges

    • V. V. Yunnikova
    • A. A. Romanko

    The Metrological Service Pages: 1105 - 1106