Measurement Techniques

, Volume 42, Issue 11, pp 1062–1067 | Cite as

Wavelet and fourier analysis of electric fluctuations in semiconductor and electrochemical systems

  • E. Yu. Budnikov
  • I. Yu. Kuboev
  • A. V. Maksimychev
  • I. N. Miroshnikova
  • S. F. Timashev
  • A. M. Gulyaev
Electromagnetic Measurements
  • 16 Downloads

Abstract

Wavelet analysis and Fourier spectroscopy were used to study electric noise observed in InSb photodiodes and in electric systems with a cation-exchange membrane in NaCl solution.

Keywords

Wavelet Analysis Wavelet Coefficient Semiconductor Device Noise Signal Morlet Wavelet 

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Copyright information

© Kluwer Academic/Plenum Publishers 1999

Authors and Affiliations

  • E. Yu. Budnikov
  • I. Yu. Kuboev
  • A. V. Maksimychev
  • I. N. Miroshnikova
  • S. F. Timashev
  • A. M. Gulyaev

There are no affiliations available

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