1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 20 July 2022 Pages: 231 - 231

2. Test Technology Newsletter

   News 02 August 2022 Pages: 233 - 234

   

3. A Systematic Bit Selection Method for Robust SRAM PUFs

   • Wendong Wang
   • Adit D. Singh
   • Ujjwal Guin

   OriginalPaper 07 June 2022 Pages: 235 - 246

   

4. The Detection of Malicious Modifications in the FPGA

   • Kamran Zahid

   OriginalPaper 30 May 2022 Pages: 247 - 260

   

5. Cross-PUF Attacks: Targeting FPGA Implementation of Arbiter-PUFs

   • Trevor Kroeger
   • Wei Cheng
   • Naghmeh Karimi

   OriginalPaper 30 June 2022 Pages: 261 - 277

   

6. Research on Analog Integrated Circuit Test Parameter Set Reduction Based on XGBoost

   • Yindong Xiao
   • Yutong Zeng
   • Chong Hu

   OriginalPaper 24 June 2022 Pages: 279 - 288

   

7. A Source-code Aware Method for Software Mutation Testing Using Artificial Bee Colony Algorithm

   • Bahman Arasteh
   • Parisa Imanzadeh
   • Bagher Zarei

   OriginalPaper 29 June 2022 Pages: 289 - 302

   

8. Deep Soft Error Propagation Modeling Using Graph Attention Network

   • Junchi Ma
   • Zongtao Duan
   • Lei Tang

   OriginalPaper 08 June 2022 Pages: 303 - 319

   

9. Built-In Self-Test for Multi-Threshold NULL Convention Logic Asynchronous Circuits using Pipeline Stage Parallelism

   • Brett Sparkman
   • Scott C. Smith
   • Jia Di

   OriginalPaper 17 June 2022 Pages: 321 - 334