Detecting Hardware Trojans using On-chip Sensors in an ASIC Design Shane KellyXuehui ZhangAndrew Ferraiuolo OriginalPaper 20 February 2015 Pages: 11 - 26
Harzard-Based ATPG for Improving Delay Test Quality Tieqiao LiuYingbo ZhouShuo Cai OriginalPaper 11 January 2015 Pages: 27 - 34
Pseudo Functional Path Delay Test through Embedded Memories Yukun GaoTengteng ZhangD. M. H. Walker OriginalPaper 18 December 2014 Pages: 35 - 42
A Power Efficient BIST TPG Method on Don’t Care Bit Based 2-D Adjusting and Hamming Distance Based 2-D Reordering Haiying YuanKun GuoHongying Song OriginalPaper 17 February 2015 Pages: 43 - 52
A New Test Point Selection Method for Analog Circuit Dongsheng ZhaoYuzhu He OriginalPaper 22 January 2015 Pages: 53 - 66
On-Wafer Calibration Technique for High Frequency Measurement with Simultaneous Voltage and Current Tuning B. M. Farid RahmanYujia PengpengGuoan Wang OriginalPaper 28 November 2014 Pages: 67 - 73
Compressive Sampling Coupled OFDM Technique for Testing Continuous Wave Radar Mohamed MetwallyNicholai L’EsperanceTian Xia OriginalPaper 19 December 2014 Pages: 75 - 83
Low Cost Sparse Multiband Signal Characterization Using Asynchronous Multi-Rate Sampling: Algorithms and Hardware Nicholas TzouDebesh BhattaAbhijit Chatterjee OriginalPaper 30 January 2015 Pages: 85 - 98
Pattern Generation for Understanding Timing Sensitivity to Power Supply Noise Tengteng ZhangYukun GaoD. M. H. Walker OriginalPaper 20 December 2014 Pages: 99 - 106
Improving Semiconductor Reliability with Advanced Engineering Methods in Test Program Development Stefan VockOmar EscalonaColin Turner OriginalPaper 19 November 2014 Pages: 107 - 117
Analog Circuit Fault Diagnosis via Sensitivity Computation Wenxin YuYigang He OriginalPaper 19 February 2015 Pages: 119 - 122
