1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 02 October 2014 Pages: 491 - 492

2. Test Technology Newsletter

   News 23 September 2014 Pages: 493 - 494

   

3. Dynamic Threshold Delay Characterization Model for Improved Static Timing Analysis

   • Pulkit Bhatnagar
   • Sachin Garg

   OriginalPaper 16 August 2014 Pages: 495 - 504

   

4. Fault Diagnosis of Analog Circuit Based on High-Order Cumulants and Information Fusion

   • Tao Xie
   • Yigang He

   OriginalPaper 27 September 2014 Pages: 505 - 514

   

5. Low Cost Built-in Sensor Testing of Phase-Locked Loop Dynamic Parameters

   • Sen-Wen Hsiao
   • Xian Wang
   • Abhijit Chatterjee

   OriginalPaper 20 September 2014 Pages: 515 - 526

   

6. Adaptive Bayesian Diagnosis of Intermittent Faults

   • Laura Rodríguez Gómez
   • Alejandro Cook
   • Hans-Joachim Wunderlich

   OriginalPaper 30 September 2014 Pages: 527 - 540

   

7. Intra-Cell Defects Diagnosis

   • Z. Sun
   • A. Bosio
   • E. Auvray

   OriginalPaper 30 September 2014 Pages: 541 - 555

   

8. Dynamic X-filling for Peak Capture Power Reduction for Compact Test Sets

   • Stephan Eggersglüß

   OriginalPaper 06 September 2014 Pages: 557 - 567

   

9. Optimal Test Scheduling Formulation under Power Constraints with Dynamic Voltage and Frequency Scaling

   • Spencer K. Millican
   • Kewal K. Saluja

   OriginalPaper 21 September 2014 Pages: 569 - 580

   

10. Testing Methods for PUF-Based Secure Key Storage Circuits

    • Mafalda Cortez
    • Gijs Roelofs
    • Giorgio Di Natale

    OriginalPaper 17 September 2014 Pages: 581 - 594

    

11. A New Analytical Model of SET Latching Probability for Circuits Experiencing Single- or Multiple-Cycle Single-Event Transients

    • Hoda Pahlevanzadeh
    • Qiaoyan Yu

    OriginalPaper 23 September 2014 Pages: 595 - 609

    

12. On the Test and Mitigation of Malfunctions in Low-Power SRAMs

    • L. H. Bonet Zordan
    • A. Bosio
    • N. Badereddine

    OriginalPaper 05 October 2014 Pages: 611 - 627

    

13. Estiamtion and Correction of Mismatch Errors in Time-Interleaved ADCs

    • Zhigang Wang
    • Lianping Guo
    • Tao Liu

    OriginalPaper 07 September 2014 Pages: 629 - 635