Fault Models for Quantum Mechanical Switching Networks Jacob D. BiamonteJeff S. AllenMarek A. Perkowski OriginalPaper 16 November 2010 Pages: 499 - 511
Test Set Compression Through Alternation Between Deterministic and Pseudorandom Test Patterns Ahmad A. Al-YamaniEdward J. McCluskey OriginalPaper 02 October 2010 Pages: 513 - 521
A Novel Test Point Selection Method for Analog Fault Dictionary Techniques ChengLin YangShuLin TianFang Chen OriginalPaper 01 September 2010 Pages: 523 - 534
Classification of Activated Faults in the FlexRay-Based Networks Yasser SedaghatSeyed Ghassem Miremadi OriginalPaper 20 July 2010 Pages: 535 - 547
JTAG Security System Based on Credentials Keunyoung ParkSang Guun YooJuho Kim OriginalPaper 01 September 2010 Pages: 549 - 557
Design of Memories with Concurrent Error Detection and Correction by Nonlinear SEC-DED Codes Zhen WangMark KarpovskyKonrad J. Kulikowski OriginalPaper 11 August 2010 Pages: 559 - 580
Efficient Concurrent Self-Test with Partially Specified Patterns Michael A. KochteChristian G. ZoellinHans-Joachim Wunderlich OriginalPaper 27 August 2010 Pages: 581 - 594