1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 05 October 2010 Pages: 495 - 495

2. Test Technology Newsletter

   News 01 October 2010 Pages: 497 - 498

3. Fault Models for Quantum Mechanical Switching Networks

   • Jacob D. Biamonte
   • Jeff S. Allen
   • Marek A. Perkowski

   OriginalPaper 16 November 2010 Pages: 499 - 511

   

4. Test Set Compression Through Alternation Between Deterministic and Pseudorandom Test Patterns

   • Ahmad A. Al-Yamani
   • Edward J. McCluskey

   OriginalPaper 02 October 2010 Pages: 513 - 521

   

5. A Novel Test Point Selection Method for Analog Fault Dictionary Techniques

   • ChengLin Yang
   • ShuLin Tian
   • Fang Chen

   OriginalPaper 01 September 2010 Pages: 523 - 534

   

6. Classification of Activated Faults in the FlexRay-Based Networks

   • Yasser Sedaghat
   • Seyed Ghassem Miremadi

   OriginalPaper 20 July 2010 Pages: 535 - 547

   

7. JTAG Security System Based on Credentials

   • Keunyoung Park
   • Sang Guun Yoo
   • Juho Kim

   OriginalPaper 01 September 2010 Pages: 549 - 557

   

8. Design of Memories with Concurrent Error Detection and Correction by Nonlinear SEC-DED Codes

   • Zhen Wang
   • Mark Karpovsky
   • Konrad J. Kulikowski

   OriginalPaper 11 August 2010 Pages: 559 - 580

   

9. Efficient Concurrent Self-Test with Partially Specified Patterns

   • Michael A. Kochte
   • Christian G. Zoellin
   • Hans-Joachim Wunderlich

   OriginalPaper 27 August 2010 Pages: 581 - 594