1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 23 October 2009 Pages: 285 - 285

2. Test Technology Newsletter

   News 27 October 2009 Pages: 287 - 288

   

3. PSL Assertion Checking Using Temporally Extended High-Level Decision Diagrams

   • Maksim Jenihhin
   • Jaan Raik
   • Raimund Ubar

   OriginalPaper 13 October 2009 Pages: 289 - 300

   

4. Utilizing On-chip Resources for Testing Embedded Mixed-signal Cores

   • Carsten Wegener
   • Heinz Mattes
   • Sebastian Sattler

   OriginalPaper 09 December 2009 Pages: 301 - 308

   

5. On Boosting the Accuracy of Non-RF to RF Correlation-Based Specification Test Compaction

   • Nathan Kupp
   • Petros Drineas
   • Yiorgos Makris

   OriginalPaper 10 September 2009 Pages: 309 - 321

   

6. LPTest: a Flexible Low-Power Test Pattern Generator

   • Meng-Fan Wu
   • Kai-Shun Hu
   • Jiun-Lang Huang

   OriginalPaper 08 October 2009 Pages: 323 - 335

   

7. A Better Method than Tail-fitting Algorithm for Jitter Separation Based on Gaussian Mixture Model

   • Fangyuan Nan
   • Yaonan Wang
   • Xiaoping Ma

   Letter Open access 10 September 2009 Pages: 337 - 342

   

8. On Built-In Self-Test for Adders

   • Mary D. Pulukuri
   • Charles E. Stroud

   Letter 24 September 2009 Pages: 343 - 346

   

9. Low-Area Wrapper Cell Design for Hierarchical SoC Testing

   • Kyuchull Kim
   • Kewal K. Saluja

   Letter 11 November 2009 Pages: 347 - 352