PSL Assertion Checking Using Temporally Extended High-Level Decision Diagrams Maksim JenihhinJaan RaikRaimund Ubar OriginalPaper 13 October 2009 Pages: 289 - 300
Utilizing On-chip Resources for Testing Embedded Mixed-signal Cores Carsten WegenerHeinz MattesSebastian Sattler OriginalPaper 09 December 2009 Pages: 301 - 308
On Boosting the Accuracy of Non-RF to RF Correlation-Based Specification Test Compaction Nathan KuppPetros DrineasYiorgos Makris OriginalPaper 10 September 2009 Pages: 309 - 321
LPTest: a Flexible Low-Power Test Pattern Generator Meng-Fan WuKai-Shun HuJiun-Lang Huang OriginalPaper 08 October 2009 Pages: 323 - 335
A Better Method than Tail-fitting Algorithm for Jitter Separation Based on Gaussian Mixture Model Fangyuan NanYaonan WangXiaoping Ma Letter Open access 10 September 2009 Pages: 337 - 342
On Built-In Self-Test for Adders Mary D. PulukuriCharles E. Stroud Letter 24 September 2009 Pages: 343 - 346
Low-Area Wrapper Cell Design for Hierarchical SoC Testing Kyuchull KimKewal K. Saluja Letter 11 November 2009 Pages: 347 - 352