1. Editorial

   • Vishwani D. Agrawal

   Legacy Pages: 195 - 195

2. Testability Properties of Divergent Trees

   • R.D. (Shawn) Blanton
   • John P. Hayes

   OriginalPaper Pages: 197 - 209

3. Redundancy Removal during High-Level Synthesis Using Scheduling Don‘t-Cares

   • Wayne Wolf

   OriginalPaper Pages: 211 - 225

4. Distributed Test Pattern Generation for Stuck-At Faults in Sequential Circuits

   • Peter A. Krauss
   • Andreas Ganz
   • Kurt J. Antreich

   OriginalPaper Pages: 227 - 245

5. Multiple Experiment Environments for Testing

   • Karen Panetta Lentz
   • Elias S. Manolakos
   • Jamie Heller

   OriginalPaper Pages: 247 - 262

6. Determining Aliasing Probabilities in BIST by Counting Strings

   • Rodrigue Byrne

   OriginalPaper Pages: 263 - 272

7. Failure Analysis of VLSI by I_DDQ Testing

   • Steven Haehn
   • T.S. Kalkur

   OriginalPaper Pages: 273 - 283