Testability Properties of Divergent Trees R.D. (Shawn) BlantonJohn P. Hayes OriginalPaper Pages: 197 - 209
Redundancy Removal during High-Level Synthesis Using Scheduling Don‘t-Cares Wayne Wolf OriginalPaper Pages: 211 - 225
Distributed Test Pattern Generation for Stuck-At Faults in Sequential Circuits Peter A. KraussAndreas GanzKurt J. Antreich OriginalPaper Pages: 227 - 245
Multiple Experiment Environments for Testing Karen Panetta LentzElias S. ManolakosJamie Heller OriginalPaper Pages: 247 - 262
Determining Aliasing Probabilities in BIST by Counting Strings Rodrigue Byrne OriginalPaper Pages: 263 - 272