1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 27 November 2007 Pages: 465 - 465

2. Test Technology Newsletter - December 2007

   • Bruce Kim

   News 27 November 2007 Pages: 467 - 468

3. Guest Editorial

   • Marcelo Lubaszewski
   • Andrew Richardson
   • C. C. Su

   EditorialNotes 24 November 2007 Pages: 469 - 469

4. Estimation of Test Metrics for the Optimisation of Analogue Circuit Testing

   • Ahcène Bounceur
   • Salvador Mir
   • Luis Rolíndez

   OriginalPaper 11 October 2007 Pages: 471 - 484

   

5. Oscillation Test Scheme of SC Biquad Filters Based on Internal Reconfiguration

   • Uroš Kač
   • Franc Novak

   OriginalPaper 10 October 2007 Pages: 485 - 495

   

6. Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis

   • T. R. Balen
   • J. V. Calvano
   • M. Renovell

   OriginalPaper 10 October 2007 Pages: 497 - 512

   

7. Hard-Fault Detection and Diagnosis During the Application of Model-Based Data Converter Testing

   • Carsten Wegener
   • Michael Peter Kennedy

   OriginalPaper 24 October 2007 Pages: 513 - 525

   

8. A Fully-Settled Linear Behavior Plus Noise Model for Evaluating the Digital Stimuli of the Design-for-Digital-Testability Σ-Δ Modulators

   • Hao-Chiao Hong

   OriginalPaper 19 October 2007 Pages: 527 - 538

   

9. Fast PWM-Based Test for High Resolution ΣΔ ADCs

   • Daniela De Venuto
   • Leonardo Reyneri

   OriginalPaper 24 October 2007 Pages: 539 - 548

   

10. Oscillator-Based Reconfigurable Sinusoidal Signal Generator for ADC BIST

    • Hsin-Wen Ting
    • Cheng-Wu Lin
    • Soon-Jyh Chang

    OriginalPaper 10 October 2007 Pages: 549 - 558

    

11. A Design-Based Structural Test Method for a Switched-Resistor DAC

    • Lei Ma
    • Geert Seuren
    • Leon van der Dussen

    OriginalPaper 13 November 2007 Pages: 559 - 567

    

12. Component Value Calculations and Characterizations for Measurements in the IEEE 1149.4 Environment

    • Teuvo Saikkonen
    • Markku Moilanen

    OriginalPaper 11 October 2007 Pages: 569 - 579

    

13. Methods of Testing Discrete Semiconductors in the 1149.4 Environment

    • Jari Hannu
    • Markku Moilanen

    OriginalPaper 10 October 2007 Pages: 581 - 592

    

14. A Robust 130 nm-CMOS Built-In Current Sensor Dedicated to RF Applications

    • M. Cimino
    • H. Lapuyade
    • J. B. Bégueret

    OriginalPaper 12 October 2007 Pages: 593 - 603

    

15. A Module for BiST of CMOS RF Receivers

    • Kay Suenaga
    • Rodrigo Picos
    • Eugeni García

    OriginalPaper 09 October 2007 Pages: 605 - 612

    

16. Reducing Test Time Using an Enhanced RF Loopback

    • Marcelo Negreiros
    • Luigi Carro
    • Altamiro Amadeu Susin

    OriginalPaper 16 October 2007 Pages: 613 - 623

    

17. A Case Study on Phase-Locked Loop Automatic Layout Generation and Transient Fault Injection Analysis

    • Cristiano Lazzari
    • Ricardo A. L. Reis
    • Lorena Anghel

    Letter 21 November 2007 Pages: 625 - 633