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An in-depth examination of opto-electrical properties of In-Yb2O3 thin films and fabricated Al/In-Yb2O3/p-Si (MIS) hetero junction diodes

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Abstract

In the proposed work, the thin films have been effectively synthesized by doping the post-transition metal with rare earth metal (In-Yb2O3) on a large scale using a low-cost jet nebulizer spray pyrolysis technique at different indium (In) doping concentration (0, 1.5, 2.5, 3.5, and 4.5 wt %) with optimized substrate temperature 550 °C. The structural, morphological and opto-electrical properties are investigated using various characterization techniques. Here, the high-quality single-phase cubic structure film was observed by X-ray diffraction (XRD) analysis. The field emission scanning electron microscope (FESEM) image reveals the change in morphology with indium (In) concentration in Yb2O3 thin films. The elemental composition study approves the presence of Yb, In and O. The transmittance, optical indirect energy gap of In-Yb2O3 films have been analyzed by UV–Vis spectra. DC electrical analysis records an improved conductivity and reduced average activation energy for higher doping content of In-Yb2O3 thin films. Notably, all the diodes shows positive photo conducting properties. Specifically, when the Al/In-Yb2O3/p-Si Schottky barrier diode fabricated with higher doping concentration such as 4.5 wt. % produces the minimum ideality factor (1.791), maximum barrier height (0.692 eV) and higher photosensitive diodes.

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Acknowledgements

The authors would like to express their gratitude to Advance Research Instrumentation Centre (ARIC), Sri Ramakrishna Mission Vidyalaya College of Arts and Science, Coimbatore for providing instrument facilities. Also, the author Mohd Shkir from KKU would like to express his gratitude to Deanship of Scientific Research at King Khalid University, Abha, Saudi Arabia for funding this work through Research Groups Program under Grant No. R.G.P.2/60/42.

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K. S. Mohan contributed to writing of the original draft, validation, investigation and methodology. A. Panneerselvam contributed to writing, supervision, review and editing. J. Chandrasekaran contributed to review and editing. R. Marnadu contributed to validation, investigation, methodology, writing of the original draft, review and editing. Mohd. Shkir contributed to writing of the original draft, review and editing.

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Correspondence to A. Panneerselvam.

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Mohan, K.S., Panneerselvam, A., Chandrasekaran, J. et al. An in-depth examination of opto-electrical properties of In-Yb2O3 thin films and fabricated Al/In-Yb2O3/p-Si (MIS) hetero junction diodes. Appl Nanosci 11, 1617–1635 (2021). https://doi.org/10.1007/s13204-021-01817-4

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  • DOI: https://doi.org/10.1007/s13204-021-01817-4

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