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Studying surfaces and thin films using Mössbauer spectroscopy

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Abstract

Using a series of bi-layer samples, we show how Conversion Electron Mössbauer Spectroscopy (CEMS) and X-ray Backscatter Mössbauer Spectroscopy (XBS) can be done with the same experimental set up. The penetration depths of the K and L conversion electrons are measured as 51(6) and 330(240) nm, respectively, with relative contributions of 88(9) and 12(9)%. The penetration depth of the Fe-K α X-ray signal is determined to be 3.6(2) μm. As a demonstration we show data on surface damage effects in electropolished TRIP steels, and by comparing CEMS and XBS Mössbauer patterns we estimate the thickness of a damaged layer (created by sanding) to be 550(50) nm.

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Authors and Affiliations

  1. Center for the Physics of Materials, Department of Physics, McGill University, Rutherford Building, 3600 University Street, Montréal, Québec, Canada, H3A 2T8

    Laura K. Perry, D. H. Ryan & R. Gagnon

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  1. Laura K. Perry
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  2. D. H. Ryan
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  3. R. Gagnon
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Correspondence to Laura K. Perry.

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Perry, L.K., Ryan, D.H. & Gagnon, R. Studying surfaces and thin films using Mössbauer spectroscopy. Hyperfine Interact 170, 131–143 (2006). https://doi.org/10.1007/s10751-006-9463-6

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