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Electronic structure and transport measurements of amorphous transition-metal oxides: observation of Fermi glass behavior

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Abstract

We characterized the conduction mechanisms in thin sputtered films of three representative binary Me–O (Me=Ta, W, and Nb) systems as a function of oxygen content, by combining in situ chemical state and electronic band structure studies from X-ray photoemission with temperature-dependent transport measurements. Despite certain differences, these amorphous films all displayed Fermi glass behavior following an oxidation-induced transition from metallic to hopping conduction, down to a sub-percolation threshold. The electron localization estimated from the band structure was in good agreement with that from the transport measurements, and the two were used to construct phase diagrams of conduction in the degree of oxidation-conductivity coordinates, which should prove important in the design of resistive switching and other electronic devices.

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References

  1. D.W. Bullett, J. Phys. C: Solid State Phys. 16, 2197 (1983)

    Article  ADS  Google Scholar 

  2. K. Mašek, P. Blumentrit, J. Beran, T. Skála, I. Píš, J. Libra, V. Matolín, Surf. Interface Anal. 42, 540 (2010)

    Article  Google Scholar 

  3. A. Romanyuk, P. Oelhafren, Sol. Energy Mater. Sol. Cells 84, 1945 (2006)

    Google Scholar 

  4. L. Weinhardt, M. Blum, M. Bär, C. Heske, B. Cole, B. Marsen, E.L. Miller, J. Phys. Chem. C 112, 3078 (2008)

    Article  Google Scholar 

  5. S. Santucci, L. Lozzi, E. Maccallini, M. Passacantando, L. Ottaviano, J. Vac. Sci. Technol. A 19, 1467 (2001)

    Article  ADS  Google Scholar 

  6. S.-J. Kim, B.J. Cho, M.B. Yu, M.-F. Li, Y.-Z. Xiong, C. Zhu, A. Chin, D.-L. Kwong, IEEE Electron Device Lett. 26, 625 (2005)

    Article  ADS  Google Scholar 

  7. E. Atanassova, Microelectron. Reliab. 39, 1185 (1999)

    Article  Google Scholar 

  8. J. Robertson, Eur. Phys. J. Appl. Phys. 28, 265 (2004)

    Article  ADS  Google Scholar 

  9. R. Waser, M. Aono, Nat. Mater. 6, 833 (2007)

    Article  ADS  Google Scholar 

  10. A. Sawa, Mater. Today 11, 28 (2008)

    Article  Google Scholar 

  11. D.B. Strukov, G.S. Snider, D.R. Stewart, R.S. Williams, Nature 453, 80 (2008)

    Article  ADS  Google Scholar 

  12. J.J. Yang, M.D. Pickett, X. Li, D.A.A. Ohlberg, D.R. Stewart, R.S. Williams, Nat. Nanotechnol. 3, 429 (2008)

    Article  Google Scholar 

  13. D.S. Shang, L. Shi, J.R. Sun, B.G. Shen, F. Zhuge, R.W. Li, Y.G. Zhao, Appl. Phys. Lett. 96, 072103 (2010)

    Article  ADS  Google Scholar 

  14. J.P. Strachan, G. Medeiros-Ribeiro, J.J. Yang, M.X. Zhang, F. Miao, I. Goldfarb, V. Holt, M. Rose, R.S. Williams, Appl. Phys. Lett. 98, 242114 (2011)

    Article  ADS  Google Scholar 

  15. J.J. Yang, M.X. Zhang, J.P. Strachan, F. Miao, M.D. Pickett, R.D. Kelley, G. Medeiros-Ribeiro, R.S. Williams, Appl. Phys. Lett. 97, 232102 (2010)

    Article  ADS  Google Scholar 

  16. M.-J. Lee, C.B. Lee, D. Lee, S.R. Lee, M. Chang, J.H. Hur, Y.-B. Kim, C.-J. Kim, D.H. Seo, S. Seo, U.-I. Chung, I.-K. Yoo, K. Kim, Nat. Mater. 10, 625 (2011)

    Article  ADS  Google Scholar 

  17. E.g., see www.springermaterials.com

  18. M. Grundner, J. Halbritter, J. Appl. Phys. 51, 397 (1979)

    Article  ADS  Google Scholar 

  19. J.M. Honig, L.L. Van Zandt, Annu. Rev. Mater. Sci. 5, 225 (1975)

    Article  ADS  Google Scholar 

  20. S.H. Shin, T. Halpern, P.M. Raccah, J. Appl. Phys. 48, 3150 (1977)

    Article  ADS  Google Scholar 

  21. B. Lalevic, M. Shoga, Thin Solid Films 75, 199 (1981)

    Article  ADS  Google Scholar 

  22. S. Lecuyer, A. Quemerais, G. Jezequel, Surf. Interface Anal. 18, 257 (1992)

    Article  Google Scholar 

  23. Y. Imai, A. Watanabe, M. Mukaida, K. Osato, T. Tsunoda, T. Kameyama, K. Fukuda, Thin Solid Films 261, 76 (1995)

    Article  ADS  Google Scholar 

  24. O. Kerrec, D. Devillieres, H. Groult, P. Marcus, Mater. Sci. Eng. B 55, 134 (1998)

    Article  Google Scholar 

  25. N.V. Alov, J. Anal. Chem. 60, 431 (2005)

    Article  Google Scholar 

  26. M. Khanuja, H. Sharma, B.R. Mehta, S.M. Shivaprasad, J. Electron Spectrosc. Relat. Phenom. 169, 41 (2009)

    Article  Google Scholar 

  27. V.R.R. Medicherla, S. Majumder, D. Paramanik, S. Varma, J. Electron Spectrosc. Relat. Phenom. 180, 1 (2010)

    Article  Google Scholar 

  28. P. Prieto, L. Galan, J.M. Sanz, Appl. Surf. Sci. 70–71, 186 (1993)

    Article  Google Scholar 

  29. N.F. Mott, E.A. Davies, Electronic Processes in Non-crystalline Materials (Clarendon, Oxford, 1979)

    Google Scholar 

  30. H. von Löhneysen, Adv. Solid State Phys. 40, 143 (2000)

    Article  Google Scholar 

  31. M. Pollak, J. Non-Cryst. Solids 11, 1 (1972)

    Article  ADS  Google Scholar 

  32. M. Imada, A. Fujimori, Y. Tokura, Rev. Mod. Phys. 70, 1039 (1998)

    Article  ADS  Google Scholar 

  33. T. Serin, A. Yildiz, N. Serin, N. Yildirim, F. Özyurt, M. Kasap, J. Electron. Mater. 39, 1152 (2010)

    Article  ADS  Google Scholar 

  34. L.A. Tracy, E.H. Hwang, K. Eng, G.A. Ten Eyck, E.P. Nordberg, K. Childs, M.S. Carroll, M.P. Lilly, S. Das Sarma, Phys. Rev. B 79, 235307 (2009)

    Article  ADS  Google Scholar 

  35. T. Ichinohe, S. Masaki, K. Uchida, S. Nozaki, H. Morisaki, Thin Solid Films 466, 27 (2004)

    Article  ADS  Google Scholar 

  36. R. Shabna, P.M. Sarun, S. Vinu, U. Syamaprasad, J. Alloys Compd. 481, 797 (2009)

    Article  Google Scholar 

  37. Z.H. Khan, M.M. Malik, M. Zulfequar, M. Husain, J. Phys., Condens. Matter 7, 8979 (1995)

    Article  ADS  Google Scholar 

  38. K.G. Lisunov, B. Raquet, H. Rakoto, J.M. Broto, E. Arushanov, X.Z. Xu, H. El Alami, C. Deville Cavellin, J. Appl. Phys. 94, 5912 (2003)

    Article  ADS  Google Scholar 

  39. K.M. Itoh, E.E. Haller, J.W. Beeman, W.L. Hansen, J. Emes, L.A. Reichertz, E. Kreysa, T. Shutt, A. Cummings, W. Stockwell, B. Sadoulet, J. Muto, J.W. Farmer, V.I. Ozhogin, Phys. Rev. Lett. 77, 4058 (1996)

    Article  ADS  Google Scholar 

  40. S. Kirkpatrick, Rev. Mod. Phys. 45, 574 (1973)

    Article  ADS  Google Scholar 

  41. L.J. Huijbregts, H.B. Brom, J.C.M. Brokken-Zijp, W.E. Kleinjan, M.A.J. Michels, Phys. Rev. B 77, 075322 (2008)

    Article  ADS  Google Scholar 

  42. B. Sixou, J.P. Travers, C. Barthet, M. Guglielmi, Phys. Rev. B 56, 4604 (1997)

    Article  ADS  Google Scholar 

  43. D. Toker, D. Azulay, N. Shimoni, I. Balberg, O. Millo, Phys. Rev. B 68, 041403(R) (2003)

    Article  ADS  Google Scholar 

  44. F. Miao, W. Yi, I. Goldfarb, J. Joshua Yang, M.-X. Zhang, M.D. Pickett, J.P. Strachan, G. Medeiros-Ribeiro, R. Stanley Williams, ACS Nano (2012, in press). doi:10.1021/nn2044577

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Acknowledgements

This research was supported in part by the SyNAPSE program of the Defense Advanced Research Projects Agency under contract HR0011-09-3-0001. The views, opinions, and/or findings contained in this article are those of the authors and should not be interpreted as representing the official views or policies, either expressed or implied, of the Defense Advanced Research Projects Agency or the Department of Defense. The authors gratefully acknowledge technical assistance of D.A.A. Ohlberg.

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Correspondence to I. Goldfarb.

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I. Goldfarb is on sabbatical leave from Faculty of Engineering, Tel Aviv University, Tel Aviv 69978, Israel.

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Goldfarb, I., Miao, F., Yang, J.J. et al. Electronic structure and transport measurements of amorphous transition-metal oxides: observation of Fermi glass behavior. Appl. Phys. A 107, 1–11 (2012). https://doi.org/10.1007/s00339-012-6856-z

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  • DOI: https://doi.org/10.1007/s00339-012-6856-z

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