Abstract
Established analytical expressions for calculating the Reciprocal Lattice Layer spacing can be used to verify the layer spacing measured in Convergent Beam Electron Diffraction (CBD) Patterns. Within experimental error, the measured layer spacing compares well with the calculated spacing for primitive crystal systems. For crystal systems with higher symmetry, the measured and calculated spacings can differ by integral values due to systematic extinctions in non-zero Laue Zones. If the calculated and measured spacings differ by non-integral values, then the indexing of the zero layer pattern, and, consequently, the indices of the zone axis are in error. This analysis was found to be extremely useful in reducing the ambiguity which usually arises in indexing only the zero-layer diffraction zone.
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References
J.W. Steeds:Introduction to Analytical Electron Microscopy, J. J. Hren, J. I. Goldstein, and D. C. Joy, eds., Plenum Publishing Company, New York, NY, 1979, pp. 387–422.
D. B. Williams:Norelco Reporter, Philips Electronic Instruments Inc., 85 Mckee Drive, Mahwah, NJ 07430, 1983, vol. 30, no. 2.
M. Raghavan, J. Y. Koo, and R. Petkovic-Luton:J. Metals, June 1983, p. 414.
K. W. Andrews, D. J. Dyson, and S. R. Keown:Interpretation of Electron Diffraction Patterns, Hilger, London, 1971.
A. Kelly and G.W. Groves:Crystallography and Crystal Defects, Addison-Wesley Publishing Co., New York, NY, 1970.
International Tables for X-ray Crystallography, Kynoch Press, Birmingham, England, 1972, vol. II, p. 101.
M. Raghavan, J. W. Steeds, and R. Petkovic-Luton:Metall. Trans. A, 1982, vol. 13A, p. 953.
J.W. Steeds and N. S. Evans:Proc. Thirty-Eighth Annual Electron Microscopy Society of America, G. W. Bailey, ed., Claitor’s Publishing Co., Baton Rouge, LA, 1980, p. 188.
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Raghavan, M., Scanlon, J.C. & Steeds, J.W. Use of Reciprocal Lattice Layer Spacing in Convergent Beam Electron Diffraction Analysis. Metall Trans A 15, 1299–1302 (1984). https://doi.org/10.1007/BF02648557
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DOI: https://doi.org/10.1007/BF02648557