Abstract
Topographies of silica glass surfaces developed by 20 keV Ar+ irradiation contain features which are not adequately explained by considering only the variation of sputtering yield with the ion-incidence angle. These features are sharply defined and could lead to serious misinterpretation of specimen structures when sputter-erosion is used as a microscopic sectioning technique. Three mechanisms are discussed which together could account for the observed discrepancies, the first being ion-reflection at grazing incidence, the second the phenomenon of forward-peaked emission of high-energy secondary particles under irradiation at high angles of incidence and the third being re-deposition of sputtered material onto closely adjacent planes. A general expression is derived for this latter mechanism for a cosine spatial distribution of sputtered particles.
Similar content being viewed by others
References
H. Bach,J. Non-Cryst. Solids 3 (1970) 1.
J. S. Colligon, Report on the Atomic Collisions in Solids Group Meeting, Sept. 1970,Phys. Bull. (Institute of Physics, London)21 (1970) 518.
G. Carter andJ. S. Colligon, Ion Bombardment of Solids (Heinemann, London 1968).
R. G. Wilson,Opt. and Laser Technol. 2 (1970) 19.
A. D. G. Stewart andM. W. Thompson,J. Mater. Sci. 4 (1969) 61.
M. Nobes, J. S. Colligon, andG. Carter,ibid 6 (1971) 115.
A. R. Bayly andP. D. Townsend,Opt. and Laser Technol. 2 (1970) 117.
G. K. Wehner,Phys. Rev. 114 (1959) 1270.
H. H. Andersen, Proc. Internat. Conf. Atomic Collision Phenomena in Solids p. 300 (North-Holland Amsterdam, London, 1970).
A. D. Marwick, M. W. Thompson, B. W. Farmery, andG. S. Harbinson, to be published in Radiation Effects.
M. W. Thompson,Phil. Mag. 18 (1968) 377.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Bayly, A.R. Secondary processes in the evolution of sputter-topographies. J Mater Sci 7, 404–412 (1972). https://doi.org/10.1007/BF02403403
Received:
Accepted:
Issue Date:
DOI: https://doi.org/10.1007/BF02403403