Abstract
The changes in the atomic structure of amorphous Pd-Si and Ni-P alloys due to low-temperature annealing, cold-rolling and isothermal creep have been studied by the conventional X-ray diffraction. The present results on the effect of low-temperature annealing were consistent with those of amorphous Fe40Ni40P14B6 alloy studied by the energy dispersive X-ray diffraction method. In addition, the present results have indicated that the effect of cold-rolling causes small changes in the structure of amorphous Pd80Si20 alloy which are qualitatively different from the structural relaxation, and the effect of annealing plays a significant contribution in the structural change during an isothermal creep test.
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Waseda, Y., Egami, T. Effect of low-temperature annealing and deformation on the structure of metallic glasses by X-ray diffraction. J Mater Sci 14, 1249–1253 (1979). https://doi.org/10.1007/BF00561311
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DOI: https://doi.org/10.1007/BF00561311