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Electrical Characterization of Precision Piezoelectric Quartz Crystal Resonators

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Nondestructive Characterization of Materials VI

Abstract

Quartz crystal resonators find application as precision frequency sources and clocks and are often used in spacecraft, beacons, receivers, and transmitters.1 Quartz is a crystalline material having a high degree of anisotropy. For example, the temperature coefficient of quartz along the optic or z-axis is 8 × 10-6 per degree centigrade, whereas perpendicular to the z-axis it is 15 × 10-6 per degree centigrade. Crystal resonators are now manufactured from synthetically grown quartz, which undergoes several different processing steps to increase the frequency stability of the piezoelectric crystal. Quartz crystal resonators are, for example, electrostatically swept so that impurities located within the quartz material can be removed. Furthermore, the radiation susceptibility of quartz resonators can be reduced by preconditioning them with low doses of ionizing radiation like 1.25-MeV photons from a cobalt 60 source.2,3 Quartz crystal resonators are manufactured from synthetic quartz having very low levels of impurities (<1 ppm) and minimum twinning defects. This process leads to so-called Premium Q quartz for high-precision resonator applications. The unloaded Q or quality factor is typically about 2.5 to 3.0 × 106 for 5-MHz resonators.

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Suter, J.J., Norton, J.R., Besson, R. (1994). Electrical Characterization of Precision Piezoelectric Quartz Crystal Resonators. In: Green, R.E., Kozaczek, K.J., Ruud, C.O. (eds) Nondestructive Characterization of Materials VI. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-2574-5_60

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  • DOI: https://doi.org/10.1007/978-1-4615-2574-5_60

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4613-6100-8

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