Abstract
This chapter presents a study of the Cu surface chemistry and mechanics in a KIO4-based slurry. On this basis, the material removal mechanism of Cu is proposed based on the chemical-mechanical synergism theory. The results show that the Cu surface films formed in the slurry are complex and vary considerably as a function of the solution pH. Based on the surface film analysis and CMP experimental results, it can be concluded that the controlling factor during Cu CMP in a KIO4-based slurry is the chemical-mechanical synergistic effect. A high MRR and ideal surface quality could be obtained when abrasion-enhanced corrosion and corrosion-enhanced abrasion effects are high and balanced. Therefore, the weak alkaline slurries are the ideal polishing slurry during the P3 stage of Cu polishing.
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References
Anik M (2005) Selection of an oxidant for copper chemical mechanical polishing: copper-iodate system. J Appl Electrochem 35(1):1–7
Antonijevic MM, Petrovic MB (2008) Copper corrosion inhibitors: a review. Int J Electrochem Sci 3(1):1–28
Berry GM, Bravo BG, Bothwell ME, Cali GJ, Harris JE, Mebrahtu T, Michelhaugh SL, Rodriguez JF, Soriaga MP (1989) Spectroscopic and electrochemical studies of iodine coordinated to noble-metal electrode surfaces. Langmuir 5(3):707–713
Brusic V, Frisch MA, Eldridge BN, Novak FP, Kaufman FB, Rush BM, Frankel GS (1991) Copper corrosion with and without inhibitors. J Electrochem Soc 138(8):2253–2259
Cano E, López MF, Simancas J, Bastidas JM (2001) X-ray photoelectron spectroscopy study on the chemical composition of copper tarnish products formed at low humidities. J Electrochem Soc 148(1):E26–E30
Carley AF, Coughlin M, Davies PR, Morgan DJ, Wyn Roberts M (2004) Chemisorption and reaction of phenyl iodide at Cu (110) surfaces: a combined STM and XPS study. Surf Sci 555(1):L138–L142
Chen J, Bull SJ (2009) On the factors affecting the critical indenter penetration for measurement of coating hardness. Vacuum 83(6):911–920
Cheng J, Wang T, Chai Z, Lu X (2015) Tribocorrosion study of copper during chemical mechanical polishing in potassium periodate-based slurry. Tribol Lett 58(1):1–11
Deshpande S, Kuiry SC, Klimov M, Obeng Y, Seal S (2004) Chemical mechanical planarization of copper: role of oxidants and inhibitors. J Electrochem Soc 151(11):G788–G794
Du T, Luo Y, Desai V (2004a) The combinatorial effect of complexing agent and inhibitor on chemical-mechanical planarization of copper. Microelectron Eng 71(1):90–97
Du T, Tamboli D, Luo Y, Desai V (2004b) Electrochemical characterization of copper chemical mechanical planarization in KIO3 slurry. Appl Surf Sci 229(1):167–174
Gaarenstroom SW, Winograd N (1977) Initial and final state effects in the ESCA spectra of cadmium and silver oxides. J Chem Phys 67(8):3500–3506
Hernandez J, Wrschka P, Oehrlein GS (2001) Surface chemistry studies of copper chemical mechanical planarization. J Electrochem Soc 148(7):G389–G397
Jiang L, He Y, Niu X, Li Y, Luo J (2014) Synergetic effect of benzotriazole and non-ionic surfactant on copper chemical mechanical polishing in KIO4-based slurries. Thin Solid Films 558:272–278
Li J, Liu Y, Lu X, Luo J, Dai Y (2013) Material removal mechanism of copper CMP from a chemical-mechanical synergy perspective. Tribol Lett 49(1):11–19
Liang H, Martin J, Lee R (2001) Influence of oxides on friction during Cu CMP. J Electron Mater 30(4):391–395
Liang H, Le Mogne T, Martin J (2002) Interfacial transfer between copper and polyurethane in chemical-mechanical polishing. J Electron Mater 31(8):872–878
Liao C, Guo D, Wen S, Luo J (2012) Effects of chemical additives of CMP slurry on surface mechanical characteristics and material removal of copper. Tribol Lett 45(2):309–317
Lipton Duffin JA, Ivasenko O, Perepichka DF, Rosei F (2009) Synthesis of polyphenylene molecular wires by surface-confined polymerization. Small 5(5):592–597
Luo Q (2000) Copper dissolution behavior in acidic iodate solutions. Langmuir 16(11):5154–5158
McCafferty E (2005) Validation of corrosion rates measured by the Tafel extrapolation method. Corros Sci 47(12):3202–3215
Mischler S, Spiegel A, Landolt D (1999) The role of passive oxide films on the degradation of steel in tribocorrosion systems. Wear 225:1078–1087
Näsänen R (1954) Studies on copper (II) periodates. Acta Chem Scand 8(9):1587–1592
Pourbaix M (1974) Atlas of Electrochemical Equilibria in Aqueous Solutions. National Association of Corrosion Engineers, Houston
Sherwood PM (1976) X-ray photoelectron spectroscopic studies of some iodine compounds. J Chem Soc Faraday Trans 2 Mol Chem Phys 72:1805–1820
Varadarajan TK, Ramakrishna TV, Kalidas C (1997) Ion solvation of some copper (II) salts in water + N-Methyl-2-pyrrolidinone solvent mixtures at 30 °C. J Chem Eng Data 42(3):453–457
Wijekoon W, Lyktey M, Prasad PN, Garvey JF (1994) The nature of copper in thin films of copper iodide grown by laser-assisted molecular beam deposition: comparative ESCA and EDXS studies. J Phys D Appl Phys 27(7):1548
Wu Z, Zhang Z, Liu L (1997) Electrochemical studies of a Cu (II)-Cu (III) couple: Cyclic voltammetry and chronoamperometry in a strong alkaline medium and in the presence of periodate anions. Electrochim Acta 42(17):2719–2723
Zhang DQ, Goun Joo H, Yong Lee K (2009) Investigation of molybdate-benzotriazole surface treatment against copper tarnishing. Surf Interface Anal 41(3):164–169
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Cheng, J. (2018). Material Removal Mechanism of Cu in KIO4-Based Slurry. In: Research on Chemical Mechanical Polishing Mechanism of Novel Diffusion Barrier Ru for Cu Interconnect . Springer Theses. Springer, Singapore. https://doi.org/10.1007/978-981-10-6165-3_2
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DOI: https://doi.org/10.1007/978-981-10-6165-3_2
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