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XAFS for Characterization of Nanomaterials

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X-ray and Neutron Techniques for Nanomaterials Characterization

Abstract

X-ray absorption fine structure (XAFS) spectroscopy studies the modification of the X-ray absorption coefficient, above the absorption edge of a specific element, due to the presence of neighboring atoms and delivers information on materials nano- and electronic structure. The long-range translational symmetry is not a prerequisite, as in the case of diffraction-based techniques, which, along with the atom-specific character of XAFS, renders it a powerful tool for the study of nanomaterials.

In the following the principles of XAFS spectroscopy will be discussed. A brief introduction of the theoretical basis of the spectroscopy will be presented, the emphasis being on the phenomena that affect the spectrum at energies below, near, and far above the absorption edge. In addition to that, the main experimental setups used for the acquisition of the XAFS spectra in the soft and hard X-ray regimes will also be presented. Furthermore, the analysis procedure of the extended part of the XAFS (called extended XAFS, acronym EXAFS) spectrum and the related parameters, as well as methodologies followed in the analyses of the near-edge part of the spectrum (called X-ray absorption near-edge structure or near-edge X-ray absorption fine structure, the corresponding acronyms being XANES and NEXAFS, respectively), will be described. Finally, recently published representative applications of XAFS spectroscopy for the study of various types of nanomaterials, for example, nanocatalysts, carbon-based nanomaterials, semiconductor quantum dots, etc., will be reviewed.

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  1. School of Physics, Department of Solid State Physics, Aristotle University of Thessaloniki, 54124, Thessaloniki, Greece

    Maria Katsikini & Eleni C. Paloura

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  1. Maria Katsikini
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  2. Eleni C. Paloura
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Correspondence to Maria Katsikini .

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  1. Integrated Mesoscale Architectures for Sustainable Catalysis (IMASC), Rowland Institute of Science, Harvard University, Cambridge, Massachusetts, USA

    Challa S.S.R. Kumar

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Katsikini, M., Paloura, E.C. (2016). XAFS for Characterization of Nanomaterials. In: Kumar, C. (eds) X-ray and Neutron Techniques for Nanomaterials Characterization. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-48606-1_4

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