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Combined AFM-SECM: Towards a novel platform for imaging microbiosensors

  • Conference paper
World Congress on Medical Physics and Biomedical Engineering, September 7 - 12, 2009, Munich, Germany

Part of the book series: IFMBE Proceedings ((IFMBE,volume 25/8))

Abstract

The combination of atomic force microscopy (AFM) and scanning electrochemical microscopy (SECM) has emerged as a versatile tool for simultaneous measurement of topographical and electro(chemical) properties at the sample surface. In particular, the implementation of a miniaturized amperometric biosensor into AFM-SECM probes is an attractive method to obtain laterally resolved information on biologically/ biomedically relevant processes. However, improvement of the electrochemical transducer is a requirement for more complex biosensor architectures.

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Authors and Affiliations

  1. School of Chemistry and Biochemistry, Georgia Institute of Technology, Atlanta, 30311, GA, U.S.A

    Justyna Wiedemair & Jong-Seok Moon

  2. School of Physiology, Emory University, Atlanta xx, GA, U.S.A

    D. E. Eaton

  3. Institute of Analytical and Bioanalytical Chemistry, University of Ulm, Albert-Einstein-Allee 11, 89081, Ulm, Germany

    Boris Mizaikoff & Christine Kranz

Authors
  1. Justyna Wiedemair
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  2. Jong-Seok Moon
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  3. D. E. Eaton
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  4. Boris Mizaikoff
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  5. Christine Kranz
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Editor information

Editors and Affiliations

  1. Inst. Biomedizinische Technik, Univ. Karlsruhe, Kaiserstr. 12, 76128, Karlsruhe, Germany

    Olaf Dössel

  2. Abt. Medizinische Physik in der Strahlentherapie, Deutsche Krebsforschungszentrum (DKFZ), Im Neuenheimer Feld 280, 69120, Heidelberg, Germany

    Wolfgang C. Schlegel

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© 2009 International Federation for Medical and Biological Engineering

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Wiedemair, J., Moon, JS., Eaton, D.E., Mizaikoff, B., Kranz, C. (2009). Combined AFM-SECM: Towards a novel platform for imaging microbiosensors. In: Dössel, O., Schlegel, W.C. (eds) World Congress on Medical Physics and Biomedical Engineering, September 7 - 12, 2009, Munich, Germany. IFMBE Proceedings, vol 25/8. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-03887-7_107

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  • DOI: https://doi.org/10.1007/978-3-642-03887-7_107

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-03886-0

  • Online ISBN: 978-3-642-03887-7

  • eBook Packages: EngineeringEngineering (R0)

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