Correction to: Chapter 9 in: K. S. Siow (ed.), Die-Attach Materials for High Temperature Applications in Microelectronics Packaging, https://doi.org/10.1007/978-3-319-99256-3_9

The original version of the book was inadvertently published with an incorrect phrase stating “Need more here. Combine with above?” in Page 237 under Section 8.1.3 Au-In. This phrase has been corrected to show “At low temperatures, Au-In forms seven IMC phases between Au and In, with AuIn2, AuIn, and Au7In3 observed in the reaction zone between Au and In even at the shortest reaction times [84].”