Skip to main content
  • Book
  • © 2020

Metrology for Inclusive Growth of India

Editors:

  • Describes the crucial role of metrology in various areas like physical–mechanical, electrical and electronics, Indian standard time, electromagnetic, environment, biomedical, and materials

  • Discusses the fundamentals of metrology

  • Is a useful read for professionals working in testing and calibration laboratories

Buying options

eBook USD 169.00
Price excludes VAT (USA)
  • ISBN: 978-981-15-8872-3
  • Instant PDF download
  • Readable on all devices
  • Own it forever
  • Exclusive offer for individuals only
  • Tax calculation will be finalised during checkout
Softcover Book USD 219.99
Price excludes VAT (USA)
Hardcover Book USD 219.99
Price excludes VAT (USA)

This is a preview of subscription content, access via your institution.

Table of contents (21 chapters)

  1. Front Matter

    Pages i-xxi
  2. International Harmonization of Measurements

    • Sanjay Yadav, Goutam Mandal, Dilip D. Shivagan, Parag Sharma, Afaqul Zafer, Dinesh K. Aswal
    Pages 37-82
  3. International Harmonization of Measurements

    • Sanjay Yadav, Goutam Mandal, Dilip D. Shivagan, Parag Sharma, Afaqul Zafer, Dinesh K. Aswal
    Pages 83-143
  4. Time and Frequency Metrology

    • Bharath Vattikonda, Manoj Das, Trilok Bhardwaj, Subhasis Panja, Poonam Arora, Anurag Gupta et al.
    Pages 145-195
  5. Time and Frequency Metrology

    • Bharath Vattikonda, Manoj Das, Trilok Bhardwaj, Subhasis Panja, Poonam Arora, Anurag Gupta et al.
    Pages 197-236
  6. Physico-Mechanical Metrology

    • Sanjay Yadav, Nita Dilawar Sharma, S. S. K. Titus, S. K. Jaiswal, V. K. Jaiswal, Naveen Garg et al.
    Pages 237-252
  7. Physico-Mechanical Metrology

    • Sanjay Yadav, Goutam Mandal, Nidhi Singh, Santwana Pati, Rina Sharma, Girija Moona et al.
    Pages 253-306
  8. Physico-Mechanical Metrology

    • Sanjay Yadav, D. D. Shivagan, Komal Bapna, V. K. Jaiswal, Parag Sharma, Shibu Saha et al.
    Pages 307-376
  9. Physico-Mechanical Metrology

    • Sanjay Yadav, S. S. K. Titus, Rajesh Kumar, Indu Elizabeth, Nita Dilawar Sharma, Ashok Kumar et al.
    Pages 377-456
  10. Electrical and Electronics Metrology: From Quantum Standard to Applications in Industry and Strategic Sectors

    • Atul S. Somkuwar, Satish, Praveen K. Siwach, Ajeet Kumar, Ajay K. Shukla, Sunil S. Kushvaha et al.
    Pages 457-521
  11. Electromagnetic Metrology for Smart Technologies

    • S. K. Dubey, Saood Ahmad, C. K. Suman, Sandhya M. Patel, Sudhir Husale, Anurag G. Reddy et al.
    Pages 523-575
  12. Electromagnetic Metrology for Smart Technologies

    • S. K. Dubey, Saood Ahmad, C. K. Suman, Sandhya M. Patel, Sudhir Husale, Anurag G. Reddy et al.
    Pages 577-638
  13. Metrology for Atmospheric Environment

    • Chhemendra Sharma, Tuhin Kumar Mandal, Sachchidanand Singh, Govind Gupta, Monika J. Kulshrestha, Prabha Johri et al.
    Pages 639-689
  14. Metrology for Atmospheric Environment

    • Chhemendra Sharma, Tuhin Kumar Mandal, Sachchidanand Singh, Govind Gupta, Monika J. Kulshrestha, Prabha Johri et al.
    Pages 691-729
  15. Biomedical Metrology: Role in Nation’s Healthcare Sector

    • Rajesh, Sumana Gajjala, Ved Varun Agrawal, D. K. Aswal
    Pages 731-766
  16. Materials Metrology and Nanomaterials

    • Sanjay R. Dhakate, Bhanu P. Singh, Bipin Kumar Gupta, Kiran M. Subhedar, Vijaykumar Toutam, Sanjay K. Srivastava et al.
    Pages 767-809
  17. Advanced Materials for Strategic and Societal Applications

    • Sanjay R. Dhakate, Bhanu P. Singh, Bipin Kumar Gupta, Kiran M. Subhedar, Sanjay Kumar Srivastava, M. Saravanan et al.
    Pages 811-879
  18. Bharatiya Nirdeshak Dravyas (BND®): Indian Certified Reference Materials.

    • R. P. Pant, S. Swarupa Tripathy, D. K. Misra, Vidya Nand Singh, Arvind Gautam, N. Vijayan et al.
    Pages 881-923
  19. Bharatiya Nirdeshak Dravyas (BND®): Indian Certified Reference Materials

    • R. P. Pant, S. Swarupa Tripathy, D. K. Misra, Vidya Nand Singh, Arvind Gautam, N. Vijayan et al.
    Pages 925-984

About this book

This book describes the significance of metrology for inclusive growth in India and explains its application in the areas of physical–mechanical engineering, electrical and electronics, Indian standard time measurements, electromagnetic radiation, environment, biomedical, materials and Bhartiya Nirdeshak Dravyas (BND®). Using the framework of “Aswal Model”, it connects the metrology, in association with accreditation and standards, to the areas of science and technology, government and regulatory agencies, civil society and media, and various other industries. It presents critical analyses of the contributions made by CSIR-National Physical Laboratory (CSIR-NPL), India, through its world-class science and apex measurement facilities of international equivalence in the areas of industrial growth, strategic sector growth, environmental protection, cybersecurity, sustainable energy, affordable health, international trade, policy-making, etc. The book will be useful for science and engineering students, researchers, policymakers and entrepreneurs.


Keywords

  • Physico-mechanical metrology
  • Electrical and electronic metrology
  • Materials Metrology
  • Biomedical metrology
  • Bhartiya Nirdeshak Dravya

Editors and Affiliations

  • CSIR-National Physical Laboratory, New Delhi, India

    Dinesh K. Aswal

About the editor

Dr. D. K. Aswal, currently Director, CSIR-National Physical Laboratory (CSIR-NPL), New Delhi and Chairman, National Accreditation Board for Testing and Calibration Laboratories (NABL), India, is maintaining lien with his position as “Outstanding Scientist” at Bhabha Atomic Research Centre (BARC), Department of Atomic Energy (DAE), Government of India, Mumbai. Dr. Aswal, during 2012–2015, has also served as Secretary, Atomic Energy Education Society (AEES), Mumbai, which is an autonomous institution under DAE. Dr. Aswal joined BARC through the training school batch of the year 1986 after completing M.Sc. in Physics (Gold medalist) from Garhwal University in 1985. He obtained his Ph.D. in Physics from Mumbai University and subsequently carried out postdoctoral research work at the Research Institute of Electronics, Hamamatsu, Japan. He is a condensed matter physicist of international repute and has made several outstanding contributions in the areas of molecular electronics, physics of organic films and their applications, thermoelectric power generators and gas sensors. He has had Visiting Professor/Scientist positions at several international institutes/universities viz. Institut d 'Electronique de Microelectronique et de Nanotechnologie (France), Shizuoka University (Japan), Commissariat à l'Energie Atomique (France), Weizmann Institute of Science (Israel), University of Yamanashi (Japan), University of Paris VII (France), Karlsruhe Institute of Technology (Germany) and the University of South Florida (USA). He is a recipient of several national and international awards/fellowships including Fellow of National Academy of Sciences, India (NASI), Academician, Asia Pacific  Academy of Materials, Distinguished Faculty Award of Homi Bhabha National Institute (HBNI), Materials Research Society of India (MRSI) Medal, Homi Bhabha Science and Technology Award, DAE-SRC Outstanding Research Investigator Award, Paraj: Excellence in Science Award, JSPS fellowship (Japan), BMBF fellowship (Germany) and EGIDE fellowship (France). He has edited four books, contributed 20 book chapters, published over 275 journal papers, filed six patents and secured the trademark of Bhartiya Nirdeshak Dravya (BND) – the Indian Certified Reference Materials.  His current focus is to enhance the metrological capabilities of India at par with international standards for continuous improvement of the quality and safety of life in the country and making CSIR-NPL as a growth engine of the nation by supporting industries and strategic sectors through apex calibration facilities.


Bibliographic Information

  • Book Title: Metrology for Inclusive Growth of India

  • Editors: Dinesh K. Aswal

  • DOI: https://doi.org/10.1007/978-981-15-8872-3

  • Publisher: Springer Singapore

  • eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)

  • Copyright Information: The Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Singapore Pte Ltd. 2020

  • Hardcover ISBN: 978-981-15-8871-6Published: 10 November 2020

  • Softcover ISBN: 978-981-15-8874-7Published: 11 November 2021

  • eBook ISBN: 978-981-15-8872-3Published: 09 November 2020

  • Edition Number: 1

  • Number of Pages: XXI, 1076

  • Number of Illustrations: 56 b/w illustrations, 442 illustrations in colour

  • Topics: Measurement Science and Instrumentation, Metrology and Fundamental Constants, Quantum Measurement and Metrology

Buying options

eBook USD 169.00
Price excludes VAT (USA)
  • ISBN: 978-981-15-8872-3
  • Instant PDF download
  • Readable on all devices
  • Own it forever
  • Exclusive offer for individuals only
  • Tax calculation will be finalised during checkout
Softcover Book USD 219.99
Price excludes VAT (USA)
Hardcover Book USD 219.99
Price excludes VAT (USA)