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Keywords
Table of contents (87 papers)
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Quantitation
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Semiconductors
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Static SIMS
Editors and Affiliations
Bibliographic Information
Book Title: Secondary Ion Mass Spectrometry SIMS II
Book Subtitle: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27–31, 1979
Editors: A. Benninghoven, C. A. Evans, R. A. Powell, R. Shimizu, H. A. Storms
Series Title: Springer Series in Chemical Physics
DOI: https://doi.org/10.1007/978-3-642-61871-0
Publisher: Springer Berlin, Heidelberg
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eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag New York 1979
Softcover ISBN: 978-3-642-61873-4Published: 13 December 2011
eBook ISBN: 978-3-642-61871-0Published: 11 November 2013
Series ISSN: 0172-6218
Series E-ISSN: 2364-9003
Edition Number: 1
Number of Pages: XIV, 300
Topics: Mass Spectrometry, Physics, general