Skip to main content
SpringerLink
Log in

Energy Filtering and Quantitative SIMS Analysis of Silicates for Major and Trace Elements

  • Conference paper
Secondary Ion Mass Spectrometry SIMS II

Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 9))

Abstract

The potential capabilities and usefulness of SIMS analysis in geochemistry including localized analysis of trace elements or of isotopic compositions of trace elements in natural minerals far outweigh existing difficulties. Systematic studies are needed to understand the sputtering/ionization process in polycomponent targets in order to establish procedures for quantitative analysis.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Log in via an institution
Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 84.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Z. Jurela, Rad. Effects, 19, 175 (1973).

    Article  Google Scholar 

  2. IA. Shimizu, Earth Planet. Sci. Lett. 39, 398 (1978).

    Article  ADS  Google Scholar 

  3. N. Shimizu and C.J. Allegre, Contrib. Mineral. Petrol. 67, 41 (1978).

    Article  ADS  Google Scholar 

  4. N. Shimizu, M.P. Semet and C.J. Allegre, Geochim. Cosmochim. Acta 42, 1321 (1978).

    Article  ADS  Google Scholar 

  5. I. Steele and I. Hutcheon, Abst. 14th Microbeam Anal. Conf. (1979).

    Google Scholar 

  6. C.A. Andersen and J.R. Hinthorne, Anal. Chem. 45, 1421 (1973).

    Article  Google Scholar 

  7. N. Andersen and P. Siamund, Kong. Dansk, Vidensk. Selsk. Mat.-fys. Medd. 39, 1 (1974).

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Department of Earth and Planetary Sciences, Massachusetts Institute of Technology, Cambridge, Massachusetts, 02139, USA

    N. Shimizu

Authors
  1. N. Shimizu
    View author publications

    You can also search for this author in PubMed Google Scholar

Editor information

Editors and Affiliations

  1. Physikalisches Institut der Universität Münster, Germany

    A. Benninghoven

  2. Charles Evans & Associates, San Mateo, CA, 94402, USA

    C. A. Evans Jr.

  3. Varian Associates, Palo Alto, CA, 94303, USA

    R. A. Powell

  4. Osaka University, Osaka, Japan

    R. Shimizu

  5. General Electric Vallecitos Nuclear Center, Pleasanton, CA, 94566, USA

    H. A. Storms

Rights and permissions

Reprints and permissions

Copyright information

© 1979 Springer-Verlag New York

About this paper

Cite this paper

Shimizu, N. (1979). Energy Filtering and Quantitative SIMS Analysis of Silicates for Major and Trace Elements. In: Benninghoven, A., Evans, C.A., Powell, R.A., Shimizu, R., Storms, H.A. (eds) Secondary Ion Mass Spectrometry SIMS II. Springer Series in Chemical Physics, vol 9. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-61871-0_18

Download citation

  • DOI: https://doi.org/10.1007/978-3-642-61871-0_18

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-61873-4

  • Online ISBN: 978-3-642-61871-0

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics

Search

Navigation