Overview
- Provides a state of the art report of the technique of ellipsometry
- Presents recent developments in ellipsometric real-time/in-situ monitoring techniques
- Is oriented towards the high technological interest in the characterization of functional organic films and surfaces
- Includes the collection of optical constants
- Written by leading scientists
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Series in Surface Sciences (SSSUR, volume 52)
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Keywords
- Biomolecules at Surfaces
- Characterization of Organic Semiconductors for OPV,
- Ellipsometric Real-time/In-situ Monitoring Techniques
- Functional and Smart Films
- Infrared Brillant Light Sources for Micro-ellipsometric Studies
- Nanostructured Surfaces
- OLEDs and OTFT
- Optical Constants
- Optical Constants of Organic Layers
- Organic and Hybrid Materials
- Smart Polymer Surfaces and Films
Table of contents (18 chapters)
-
Biomolecules at Surfaces
-
Nanostructured Surfaces and Organic/Inorganic Hybrids
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Thin Films of Organic Semiconductors for OPV, OLEDs and OTFT
-
Developments in Ellipsometric Real-Time/In-situ Monitoring Techniques
Editors and Affiliations
Bibliographic Information
Book Title: Ellipsometry of Functional Organic Surfaces and Films
Editors: Karsten Hinrichs, Klaus-Jochen Eichhorn
Series Title: Springer Series in Surface Sciences
DOI: https://doi.org/10.1007/978-3-642-40128-2
Publisher: Springer Berlin, Heidelberg
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2014
Softcover ISBN: 978-3-662-51020-9Published: 23 August 2016
eBook ISBN: 978-3-642-40128-2Published: 24 October 2013
Series ISSN: 0931-5195
Series E-ISSN: 2198-4743
Edition Number: 1
Number of Pages: XXI, 363
Number of Illustrations: 161 b/w illustrations, 55 illustrations in colour
Topics: Surface and Interface Science, Thin Films, Surfaces and Interfaces, Thin Films, Physical Chemistry, Optics, Lasers, Photonics, Optical Devices, Characterization and Evaluation of Materials