Overview
- Editors:
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Bharat Bhushan
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Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM), The Ohio State University, Columbus, USA
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Harald Fuchs
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Institute of Physics, FB 16, University of Münster, Münster, Germany
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Masahiko Tomitori
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Advanced Institute of Science & Technology, School of Materials Science, Ishikawa, Japan
- First book summarizing the state-of-the-art of this technique
- Real industrial applications included
- Includes supplementary material: sn.pub/extras
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Table of contents (12 chapters)
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- Pietro Giuseppe Gucciardi, Guillaume Bachelier, Stephan J. Stranick, Maria Allegrini
Pages 1-29
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- Hao-Chih Liu, Gregory A. Dahlen, Jason R. Osborne
Pages 31-75
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- Eugenio Cefalì, Salvatore Patanè, Salvatore Spadaro, Renato Gardelli, Matteo Albani, Maria Allegrini
Pages 77-135
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- Sophie Marsaudon, Charlotte Bernard, Dirk Dietzel, Cattien V. Nguyen, Anne Marie Bonnot, Jean-Pierre Aimé et al.
Pages 137-181
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- Andrea M. Ho, Horacio D. Espinosa
Pages 183-217
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- Hayato Sone, Sumio Hosaka
Pages 219-245
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- Vinzenz Friedli, Samuel Hoffmann, Johann Michler, Ivo Utke
Pages 247-287
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- Peter J. Cumpson, Charles A. Clifford, Jose F. Portoles, James E. Johnstone, Martin Munz
Pages 289-314
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- Suzanne P. Jarvis, John E. Sader, Takeshi Fukuma
Pages 315-350
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- Yossi Rosenwaks, Oren Tal, Shimon Saraf, Alex Schwarzman, Eli Lepkifker, Amir Boag
Pages 351-376
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- Laura Fumagalli, Ignacio Casuso, Giorgio Ferrari, G. Gomila
Pages 421-450
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Back Matter
Pages 451-465
About this book
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures,technical polymers, and near eld optics.
Editors and Affiliations
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Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM), The Ohio State University, Columbus, USA
Bharat Bhushan
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Institute of Physics, FB 16, University of Münster, Münster, Germany
Harald Fuchs
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Advanced Institute of Science & Technology, School of Materials Science, Ishikawa, Japan
Masahiko Tomitori