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Interconnect Reliability in Advanced Memory Device Packaging

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  • © 2023

Overview

  • Includes in-depth discussion on special reliability testing of advanced memory packages
  • Provides an holistic overview of interconnect materials, packaging processes in advanced memory packaging
  • Explains comprehensive materials reliability in memory device packaging

Part of the book series: Springer Series in Reliability Engineering (RELIABILITY)

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About this book

This book explains mechanical and thermal reliability for modern memory packaging, considering materials, processes, and manufacturing.


In the past 40 years, memory packaging processes have evolved enormously. This book discusses the reliability and technical challenges of first-level interconnect materials, packaging processes, advanced specialty reliability testing, and characterization of interconnects. It also examines the reliability of wire bonding, lead-free solder joints such as reliability testing and data analyses, design for reliability in hybrid packaging and HBM packaging, and failure analyses. The specialty of this book is that the materials covered are not only for second-level interconnects, but also for packaging assembly on first-level interconnects and for the semiconductor back-end on 2.5D and 3D memory interconnects. 


This book can be used as a text for college and graduate students who have the potential to become our future leaders, scientists, and engineers in the electronics and semiconductor industry.



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Keywords

Table of contents (8 chapters)

Authors and Affiliations

  • Package Development Engineering, Micron Memory Taiwan Co. Ltd., Taichung, Taiwan

    Chong Leong, Gan

  • Package Development Engineering, Micron Memory Taiwan Co. Ltd, Taichung, Taiwan

    Chen-Yu, Huang

Bibliographic Information

  • Book Title: Interconnect Reliability in Advanced Memory Device Packaging

  • Authors: Chong Leong, Gan, Chen-Yu, Huang

  • Series Title: Springer Series in Reliability Engineering

  • DOI: https://doi.org/10.1007/978-3-031-26708-6

  • Publisher: Springer Cham

  • eBook Packages: Engineering, Engineering (R0)

  • Copyright Information: The Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Switzerland AG 2023

  • Hardcover ISBN: 978-3-031-26707-9Published: 29 April 2023

  • Softcover ISBN: 978-3-031-26710-9Due: 30 May 2023

  • eBook ISBN: 978-3-031-26708-6Published: 28 April 2023

  • Series ISSN: 1614-7839

  • Series E-ISSN: 2196-999X

  • Edition Number: 1

  • Number of Pages: XVIII, 210

  • Number of Illustrations: 11 b/w illustrations, 89 illustrations in colour

  • Topics: Computer Hardware, Circuits and Systems

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