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Radiation Effects on Integrated Circuits and Systems for Space Applications

  • Raoul Velazco
  • Dale McMorrow
  • Jaime Estela

Table of contents

  1. Front Matter
    Pages i-ix
  2. Marcelo Famá, Jaime Estela
    Pages 1-11
  3. Marwan Ammar, Ghaith Bany Hamad, Otmane Ait Mohamed, Yvon Savaria
    Pages 13-38
  4. Konstantin Tapero
    Pages 39-60
  5. Heather Quinn
    Pages 83-125
  6. Luis Entrena, Mario García-Valderas, Almudena Lindoso, Marta Portela-Garcia, Enrique San Millán
    Pages 127-144
  7. Pablo Ramos, Vanessa Vargas, Raoul Velazco, Nacer-Eddine Zergainoh
    Pages 145-173
  8. Vanessa Vargas, Pablo Ramos, Jean-Francois Méhaut, Raoul Velazco
    Pages 175-203
  9. Michel Pignol
    Pages 205-247
  10. Fakhreddine Ghaffari, Olivier Romain, Bertrand Granado
    Pages 249-276
  11. João Baptista S. Martins, Jorge Johanny Sáenz Noval
    Pages 277-300
  12. Michel Pignol, Florence Malou, Corinne Aicardi
    Pages 301-327
  13. Jaime Estela
    Pages 329-346
  14. Hans-Juergen Sedlmayr, A. Beyer, K. Joehl, K. Kunze, M. Maier, T. Obermeier
    Pages 381-401

About this book

Introduction

This book provides readers with invaluable overviews and updates of the most important topics in the radiation-effects field, enabling them to face significant challenges in the quest for the insertion of ever-higher density and higher performance electronic components in satellite systems. Readers will benefit from the up-to-date coverage of the various primary (classical) sub-areas of radiation effects, including the space and terrestrial radiation environments, basic mechanisms of total ionizing dose, digital and analog single-event transients, basic mechanisms of single-event effects, system-level SEE analysis, device-level, circuit-level and system-level hardening approaches, and radiation hardness assurance. Additionally, this book includes in-depth discussions of several newer areas of investigation, and current challenges to the radiation effects community, such as radiation hardening by design, the use of Commercial-Off-The-Shelf (COTS) components in space missions, CubeSats and SmallSats, the use of recent generation FPGA’s in space, and new approaches for radiation testing and validation. The authors provide essential background and fundamentals, in addition to information on the most recent advances and challenges in the sub-areas of radiation effects.

  • Provides a concise introduction to the fundamentals of radiation effects, latest research results, and new test methods and procedures;
  • Discusses the radiation effects and mitigation solutions for advanced integrated circuits and systems designed to operate in harsh radiation environments;
  • Includes coverage of the impact of Small Satellites in the space industry.

Keywords

Fault-Tolerance Techniques for Spacecraft COTS for Low Earth Orbit Commercial Components for Space Small Satellite Market NewSpace

Editors and affiliations

  • Raoul Velazco
    • 1
  • Dale McMorrow
    • 2
  • Jaime Estela
    • 3
  1. 1.Centre Nationale Recherche Scientifique (CNRS)GrenobleFrance
  2. 2.United States Naval Research LaboratoryWashington, DCUSA
  3. 3.Spectrum Aerospace GroupMunichGermany

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-030-04660-6
  • Copyright Information Springer Nature Switzerland AG 2019
  • Publisher Name Springer, Cham
  • eBook Packages Engineering
  • Print ISBN 978-3-030-04659-0
  • Online ISBN 978-3-030-04660-6
  • Buy this book on publisher's site