Abstract
Finding the optimal optoelectronic properties (zero-order optical transmittance, shielding effectiveness, and stray light uniformity) of metallic mesh is significant for its application in electromagnetic interference shielding areas. However, there are few relevant studies at present. Based on optoelectronic properties, we propose a comprehensive evaluation factor Q, which is simple in form and can be used to evaluate the mesh with different parameters in a simple and efficient way. The effectivity of Q is verified by comparing the trend of Q values with the evaluation results of the technique for order preference by similarity to ideal solution (TOPSIS). The evaluation factor Q can also be extended to evaluate the optoelectronic properties of different kinds of metallic meshes, which makes it extremely favorable for metallic mesh design and application.
摘要
获取金属网栅最佳光电性能 (零级光学透光率、 电磁屏蔽效能和杂散光均匀性) 对其在透明电磁屏蔽领域的应用具有重要价值. 然而, 目前相关研究较少. 本文提出一种基于金属网栅光电性能的形式简单的综合评价因子Q, 可简便有效地用于不同结构参数的金属网栅光电性能评估. 评价因子Q值与TOPSIS的评估结果变化趋势一致, 验证了评价因子Q的有效性. 评价因子Q还可以对不同图案的金属网栅光电性能进行评估, 使其在金属网栅的设计和应用中具有十分广泛的应用前景.
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Zhengang LU designed the research. Yilei ZHANG performed the simulations and drafted the manuscript. Jinxuan CAO processed the data and gave suggestions for the verification methods. Heyan WANG and Jiubin TAN helped organize the manuscript. Yilei ZHANG and Zhengang LU revised and finalized the paper.
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Yilei ZHANG, Jinxuan CAO, Zhengang LU, Heyan WANG, and Jiubin TAN declare that they have no conflict of interest.
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Project supported by the National Natural Science Foundation of China (No. 61975046)
Yilei ZHANG, first author of this invited paper, received her BS degree in Automation from Guangxi University, Nanning, China. She is currently a PhD candidate at the Instrument Science and Technology from the Harbin Institute of Technology, Harbin, China. Her research interests include optical transparent electromagnetic shielding windows and tunable absorber.
Zhengang LU, corresponding author of this invited paper, received his BS and PhD degrees in Instrument Science and Technology from the Harbin Institute of Technology (HIT), Harbin, China. At present, he is a professor at the HIT, a vice director of the Center of Ultra-precision Optoelectronic Instrument Engineering, HIT. He is a corresponding expert of Front Inform Technol Electron Eng. His current research interests include micro-nano optics and electromagnetic shielding optical windows and precision instruments and engineering.
Jiubin TAN received his BS, MS, and PhD degrees in Instrument Science and Technology from the Harbin Institute of Technology (HIT), Harbin, China. He was elected as an Academician of the Chinese Academy of Engineering in 2017. He is now the president of the Precision Instrument Engineering Research Institute of the HIT, and the deputy director of the National Metrology Strategy Expert Advisory Committee. He is an editorial board member of Front Inform Technol Electron Eng. His current research interests include ultra-precision measurement technology and instrument engineering.
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Zhang, Y., Cao, J., Lu, Z. et al. Comprehensive evaluation factor of optoelectronic properties for transparent conductive metallic mesh films. Front Inform Technol Electron Eng 22, 1532–1540 (2021). https://doi.org/10.1631/FITEE.2000690
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DOI: https://doi.org/10.1631/FITEE.2000690
Key words
- Metallic mesh
- Technique for order preference by similarity to ideal solution (TOPSIS)
- Entropy weight (EW)
- Comprehensive evaluation
- Transparent conductive films