Abstract
Atomic force microscopy (AFM) is now well established among the tools of choice for the analysis and characterization of materials. Applications of AFM span many industries including chemicals, plastics, pharmaceuticals, and semiconductors. Advancements in AFM instrumentation over the last five years have expanded the range of application of this technology to investigate thermal and mechanical properties of complex materials at high spatial resolution as well as structural and morphological characterization of materials subjected to thermal and mechanical stresses. In particular, this has been an enabling technology for an improved understanding of structure–property relationships in polymeric materials including homopolymers, blends, impact-modified polymer systems, porous polymer systems, and semicrystalline polymers. Practical examples illustrate applications of contact, tapping-mode, phase-imaging, hot-stage, and scanning thermal methods for the characterization of modern industrial polymer materials.
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References
G. Binnig, C. Quate, and Ch. Gerber, Phys. Rev. Lett. 56 (1986) p. 930.
Q. Zhong, D. Innis, K. Kjoller, and V. Elings, Surf. Sci. Lett. 290 (1993) p. L688.
D.A. Chernoff, in Proc. Microscopy and Microanalysis (Jones and Bagell, New York, 1995) p. 888.
D. Ivanov, R. Daniels, and S. Magonov, “Exploring the High-Temperature AFM and Its Use for Studies of Polymers,” Application Note, Digital Instruments/Veeco Metrology Group, http://www.veeco.com/appnotes/AN45_ HeatingStage.pdf (accessed April 2004).
L. D’Orazio, C. Mancarella, E. Martuscelli, and F. Polato, Polymer 32 (1991) p. 1186.
A. Van der Wal, R. Nijhof, and R.J. Gaymans, Polymer 40 (1999) p. 6031.
C.J. Carriere and H.C. Silvis, J. Appl. Polym. Sci. 66 (1997) p. 1175.
C.B. Bucknall, Toughened Plastics (Applied Science, London, 1977).
K. Premphet and W. Paecharoenchai, J. Appl. Polym. Sci. 82 (2001) p. 2140.
Y. Thomann, R. Thomann, G. Bar, M. Ganter, B. Machutta, and R. Mülhaupt, J. Microsc. 195 (1999) p. 161.
J.C.B. Russ, Computer-Assisted Microscopy: The Measurement and Analysis of Images (Plenum Press, New York, 1990).
F.J. Padden and H.D. Keith, J. Appl. Phys. 44 (1973) p. 1217.
S.V. Meile, D.R. Ferro, S. Brückner, A.J. Lovinger, and F. J. Padden, Macromolecules 319 (1994) p. 187.
S. Brückner and S.V. Meile, Nature 340 (1989) p. 455.
S. Brückner, S.V. Meile, V. Petraccone, and B. Pirozzi, Prog. Polym. Sci. 16 (1991) p. 361.
B. Lotz and J.C. Wittmann, Prog. Colloid Polym. Sci. 87 (1992) p. 3.
I. Hamley, The Physics of Block Copolymers (Oxford University Press, Oxford, 1998).
R. Cieslinski, S. Hahn, J. Hahnfeld, M.A. Jones, C. Leibig, J. Milhaupt, G. Meyers, B. Landes, C. Langhoff, G. Parsons, M. Reinhardt, and D. Yontz, Polymer Preprints, Vol. 43, No. 1 (American Chemical Society, Washington, DC, 2002) p. 289.
J. Ruokolainen, G. Fredrickson, E. Kramer, C. Ryu, S. Hahn, S. Magonov, Macromolecules 35 (2002) p. 9391.
M. Hammond, S. Sides, G. Frederickson, E. Kramer, Macromolecules 36 (2003) p. 8712.
S. Magonov, J. Cleveland, V. Elings, D. Denley, M.-H. Whangbo, Surface Science 389 (1997) p. 201.
H.M. Pollock and A. Hammiche, J. Phys. D: Appl. Phys. 34 (1) (2001) p. R23.
T. Lever and D. Price, American Laboratory 30 (16) (1998) p. 15.
“Product Focus: LDPE,” Chemical Week 165 (19) (2003) p. 36.
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Barand, G.K., Meyers, G.F. The Application of Atomic Force Microscopy to the Characterization of Industrial Polymer Materials. MRS Bulletin 29, 464–470 (2004). https://doi.org/10.1557/mrs2004.140
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DOI: https://doi.org/10.1557/mrs2004.140