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Effects of Sulfur Concentration on the Electron Field Emission Properties of Nanocrystalline Carbon Thin Films

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The electron field emission properties of sulfur-assisted nanocrystalline carbon (n-C: S) thin films grown on molybdenum substrates by hot-filament CVD technique using methane-hydrogen (CH4/H2) and hydrogen sulfide-hydrogen (H2S/H2) gas mixtures were investigated. The field emission properties of the S-assisted films are reported as a function of sulfur concentration. The incorporation of S caused structural and microstructural changes that were characterized with SEM, AFM and Raman spectroscopy (RS). The S-assisted films show smoother surfaces and smaller grains than those grown without. The lowest turn-on field measured was around 4.5 - 5.0 V/μm films grown with 500 ppm of hydrogen sulfide and at 900 °C. The electron field emission properties of S-assisted films were also compared to those grown without sulfur (i.e., intrinsic). An inverse correlation between the threshold field (Ec) and sulfur concentration was found. These finding are attributed to defect induced states within the electronic band structure.

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Authors and Affiliations

  1. Department of Physics, University of Puerto Rico, San Juan, PO Box 23343, PR00931, USA

    S. Gupta & B. L. Weiss

  2. Department of Chemistry, University of Puerto Rico, San Juan, PO Box 23346, PR00931, USA

    B. R. Weiner

  3. Department of Physical Sciences, University of Puerto Rico, San Juan, PO Box 23323, PR00931, USA

    G. Morell

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  1. S. Gupta
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  2. B. R. Weiner
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  3. B. L. Weiss
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  4. G. Morell
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Gupta, S., Weiner, B.R., Weiss, B.L. et al. Effects of Sulfur Concentration on the Electron Field Emission Properties of Nanocrystalline Carbon Thin Films. MRS Online Proceedings Library 675, 691 (2001). https://doi.org/10.1557/PROC-675-W6.9.1

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