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Local modification of thin oxide films on a titanium surface

  • Surface Reactions
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Abstract

It is shown that a controllable structural rearrangement of a thin titanium oxide film, accompanied by a change in the bandgap width, can be accomplished under the probe tip of a scanning tunneling microscope (STM). The mechanism of the rearrangement is considered to be the migration of cations and oxygen vacancies in the electric field of the STM.

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Authors and Affiliations

  1. Semenov Institute of Chemical Physics, Russian Academy of Sciences, Moscow, Russia

    M. V. Grishin, S. A. Kovalevskii, F. I. Dalidchik, A. K. Gatin & A. A. Kirsankin

Authors
  1. M. V. Grishin
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  2. S. A. Kovalevskii
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  3. F. I. Dalidchik
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  4. A. K. Gatin
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  5. A. A. Kirsankin
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Corresponding author

Correspondence to M. V. Grishin.

Additional information

Original Russian Text © M.V. Grishin, S.A. Kovalevskii, F.I. Dalidchik, A.K. Gatin, A.A. Kirsankin, 2011, published in Khimicheskaya Fizika, 2011, Vol. 30, No. 9, pp. 84–87.

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Grishin, M.V., Kovalevskii, S.A., Dalidchik, F.I. et al. Local modification of thin oxide films on a titanium surface. Russ. J. Phys. Chem. B 5, 870–872 (2011). https://doi.org/10.1134/S1990793111090053

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  • DOI: https://doi.org/10.1134/S1990793111090053

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