Abstract
Anisotype p-Cu2ZnSnS4/n-Si heterojunctions have been manufactured for the first type by sulfidation of base-metal layers predeposited onto polycrystalline silicon substrates. Current–voltage characteristics of the heterojunctions are analyzed, and the mechanisms of current transfer are discussed. It is established that forward-biased structures are characterized by both tunneling-recombination processes and space-charge limited mobility of carriers. In reversely biased heterojunctions, space-charge limited currents predominate.
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Original Russian Text © A. Yusupov, K. Adambaev, Z.Z. Turaev, S.R. Aliev, A. Kutlimratov, 2017, published in Pis’ma v Zhurnal Tekhnicheskoi Fiziki, 2017, Vol. 43, No. 2, pp. 98–103.
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Yusupov, A., Adambaev, K., Turaev, Z.Z. et al. Creation and electrical properties of p-Cu2ZnSnS4/n-Si heterojunctions. Tech. Phys. Lett. 43, 133–135 (2017). https://doi.org/10.1134/S1063785017010291
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DOI: https://doi.org/10.1134/S1063785017010291