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Energy-dispersive X-ray-absorption edge spectrometry with spectrum filtration by X-ray mirrors

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Abstract

A highly sensitive energy-dispersive scheme with a semiconductor spectrometer is proposed for determining impurity concentrations from the X-ray-absorption edge spectra. The optimization of spectrum in a band studied is ensured by sequential reflections of transmitted radiation from X-ray mirrors and by variation of the grazing angle of the analyzed beam. Results of measurements of the X-ray-absorption edge spectra of Fe in dispersed salt samples and W impurity in beryllium plate are presented. It is shown that the problem of deconvolution can be numerically solved by smoothing X-ray-absorption fine-structure oscillations with power functions.

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Authors and Affiliations

  1. Lebedev Physical Institute, Russian Academy of Sciences, Moscow, 119991, Russia

    A. G. Tur’yanskii, S. S. Gizha, V. M. Senkov & S. K. Savel’ev

Authors
  1. A. G. Tur’yanskii
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  2. S. S. Gizha
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  3. V. M. Senkov
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  4. S. K. Savel’ev
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Corresponding author

Correspondence to A. G. Tur’yanskii.

Additional information

Original Russian Text © A.G. Tur’yanskii, S.S. Gizha, V.M. Senkov, S.K. Savel’ev, 2014, published in Pis’ma v Zhurnal Tekhnicheskoi Fiziki, 2014, Vol. 40, No. 8, pp. 56–63.

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Tur’yanskii, A.G., Gizha, S.S., Senkov, V.M. et al. Energy-dispersive X-ray-absorption edge spectrometry with spectrum filtration by X-ray mirrors. Tech. Phys. Lett. 40, 346–349 (2014). https://doi.org/10.1134/S1063785014040269

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  • DOI: https://doi.org/10.1134/S1063785014040269

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