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Prism excitation of leaky modes of thin films

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Abstract

The conditions for prism excitation of leaky modes of thin dielectric films are investigated theoretically and experimentally. The possibility of solving the inverse optical problem on reconstruction of parameters of the films guiding the leaky modes of various types are analyzed.

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Authors and Affiliations

  1. Kuleshov State University, ul. Kosmonavtov 1, Mogilev, 212022, Belarus

    A. B. Sotsky & P. Ya. Chudakovskii

  2. Metricon Corporation, Pennington, New Jersey, 08534, USA

    L. M. Steingart & J. H. Jackson

  3. Belarusian-Russian University, pr. Mira 43, Mogilev, 212005, Belarus

    L. I. Sotskaya

Authors
  1. A. B. Sotsky
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  2. L. M. Steingart
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  3. J. H. Jackson
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  4. P. Ya. Chudakovskii
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  5. L. I. Sotskaya
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Corresponding author

Correspondence to A. B. Sotsky.

Additional information

Original Russian Text © A.B. Sotsky, L.M. Steingart, J.H. Jackson, P.Ya. Chudakovskii, L.I. Sotskaya, 2013, published in Zhurnal Tekhnicheskoi Fiziki, 2013, Vol. 83, No. 11, pp. 105–115.

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Sotsky, A.B., Steingart, L.M., Jackson, J.H. et al. Prism excitation of leaky modes of thin films. Tech. Phys. 58, 1651–1660 (2013). https://doi.org/10.1134/S106378421311025X

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  • DOI: https://doi.org/10.1134/S106378421311025X

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