Abstract
The electrical conductivity is studied along the interface between dielectric films of submicrometer thicknesses. The results of the comparative study of the electrophysical properties of the individual films are presented. A commercial polymer polymethylmetacrylate is used as the dielectric material. The studies have been performed by the two-probe scheme using the method of current–voltage characteristics. The conductivity is found to anomalously increase with respect to the bulk conductivity. The increase in the conductivity is established to be related to an increase in the charge carrier mobility along the interface to 140 cm2/V s. The results are compared with the data for known analogs; it is noted that additional study of the properties of a 3D region/2D region contact is necessary.
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Funding
The work was carried out with the support of the project “Mirror Laboratories” of National Research University “Higher School of Economics” and Bashkir State Pedagogical University named after M. Akmulla.
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Translated by Yu. Ryzhkov
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Lachinov, A.N., Altynshina, G.R., Baibulova, G.S. et al. Electrophysical Properties along the Interface of Two Polymer Films of Polymethylmethacrylate. Phys. Solid State 63, 577–581 (2021). https://doi.org/10.1134/S1063783421040120
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DOI: https://doi.org/10.1134/S1063783421040120