Abstract
The regularities governing the surface modification of silicon crystals during microwave-plasma microprocessing in different chemically active gaseous media are investigated. This modification is shown to be caused by the formation of built-in surface potentials, which, depending on the semiconductor electrical-conductivity type, differently affect the field-emission properties and surface electron transport in devices based on them.
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ACKNOWLEDGMENTS
This study was supported by the Russian Science Foundation, project no. 16-19-10033.
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Translated by E. Bondareva
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Yafarov, R.K. Effect of Plasma-Chemical Surface Modification on the Electron Transport and Work Function in Silicon Crystals. Semiconductors 53, 14–21 (2019). https://doi.org/10.1134/S106378261901024X
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DOI: https://doi.org/10.1134/S106378261901024X