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Effect of Plasma-Chemical Surface Modification on the Electron Transport and Work Function in Silicon Crystals

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Abstract

The regularities governing the surface modification of silicon crystals during microwave-plasma microprocessing in different chemically active gaseous media are investigated. This modification is shown to be caused by the formation of built-in surface potentials, which, depending on the semiconductor electrical-conductivity type, differently affect the field-emission properties and surface electron transport in devices based on them.

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ACKNOWLEDGMENTS

This study was supported by the Russian Science Foundation, project no. 16-19-10033.

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Correspondence to R. K. Yafarov.

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Translated by E. Bondareva

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Yafarov, R.K. Effect of Plasma-Chemical Surface Modification on the Electron Transport and Work Function in Silicon Crystals. Semiconductors 53, 14–21 (2019). https://doi.org/10.1134/S106378261901024X

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  • DOI: https://doi.org/10.1134/S106378261901024X

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