Abstract
It is shown that the emission efficiency and the 1/f noise level in light-emitting diodes with InGaN/GaN quantum wells correlate with how the differential resistance of a diode varies with increasing current. Analysis of the results shows that hopping transport via defect states across the n-type part of the space-charge region results in limitation of the current by the tunneling resistance at intermediate currents and shunting of the n-type barrier at high currents. The increase in the average number of tunneling electrons suppresses the 1/f current noise at intermediate currents. The strong growth in the density of current noise at high currents, S J ∝ J 3, is attributed to a decrease in the average number of tunneling electrons as the n-type barrier decreases in height and width with increasing forward bias. The tunneling-recombination leakage current along extended defects grows faster than the tunneling injection current, which leads to emission efficiency droop.
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Original Russian Text © N.I. Bochkareva, A.M. Ivanov, A.V. Klochkov, V.S. Kogotkov, Yu.T. Rebane, M.V. Virko, Y.G. Shreter, 2015, published in Fizika i Tekhnika Poluprovodnikov, 2015, Vol. 49, No. 6, pp. 847–855.
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Bochkareva, N.I., Ivanov, A.M., Klochkov, A.V. et al. Hopping transport in the space-charge region of p-n structures with InGaN/GaN QWs as a source of excess 1/f noise and efficiency droop in LEDs. Semiconductors 49, 827–835 (2015). https://doi.org/10.1134/S1063782615060056
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DOI: https://doi.org/10.1134/S1063782615060056