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Determination of the composition of binary chalcogenide glasses by X-ray fluorescence analysis

  • Atomic Structure and Nonelectronic Properties of Semiconductors
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Abstract

To quantitatively determine germanium, arsenic, sulfur, and selenium contents in As1 − x S x , Ge1 − x S x , As1 − x Se x , and Ge1 − x Se x glassy alloys by X-ray fluorescence analysis, a technique using standards was developed. This technique allows quantitative determination of the composition of these glasses with an accuracy of ±0.001 with respect to the parameter x.

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Authors and Affiliations

  1. Alexander Herzen State Pedagogical University of Russia, ul. Moika 48, St. Petersburg, 191186, Russia

    G. A. Bordovsky, A. V. Marchenko & P. P. Seregin

  2. Ioffe Physicotechnical Institute, Russian Academy of Sciences, ul. Polytekhnicheskaya 26, St. Petersburg, 194021, Russia

    N. N. Smirnova & E. I. Terukov

Authors
  1. G. A. Bordovsky
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  2. A. V. Marchenko
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  3. P. P. Seregin
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  4. N. N. Smirnova
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  5. E. I. Terukov
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Corresponding author

Correspondence to P. P. Seregin.

Additional information

Original Russian Text © G.A. Bordovsky, A.V. Marchenko, P.P. Seregin, N.N. Smirnova, E.I. Terukov, 2010, published in Fizika i Tekhnika Poluprovodnikov, 2010, Vol. 44, No. 1, pp. 26–29.

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Bordovsky, G.A., Marchenko, A.V., Seregin, P.P. et al. Determination of the composition of binary chalcogenide glasses by X-ray fluorescence analysis. Semiconductors 44, 24–27 (2010). https://doi.org/10.1134/S1063782610010021

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  • DOI: https://doi.org/10.1134/S1063782610010021

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