Abstract
Electron emission from multilayer arrays of vertically coupled InAs quantum dots into the n-GaAs matrix in Schottky-barrier structures (electron concentration n ≈ 2 × 1016 cm−3) is studied by admittance spectroscopy. It is established that, in the temperature region below ∼70 K, electron emission in a rate range of 3 × 104–3 × 106 s−1 proceeds via thermally activated tunneling through intermediate virtual states. As the number of layers in the quantum dot array increases from three to ten, a decrease in the electron emission rate is observed.
Similar content being viewed by others
References
M. Geller, E. Stock, C. Kapteyn, et al., Phys. Rev. B 73, 205331 (2006).
S. Schulz, A. Schramm, C. Heyn, and W. Hansen, Phys. Rev. B 74, 033311 (2006).
S. Anand, N. Carlsson, M.-E. Pistol, et al., Appl. Phys. Lett. 67, 316 (1995).
C. M. A. Kapteyn, F. Heinrichsdorf, O. Stier, et al., Phys. Rev. B 60, 14265 (1999).
P. N. Brunkov, A. R. Kovsh, V. M. Ustinov, et al., J. Electron. Mater. 28, 486 (1999).
S. Schulz, S. Schnüll, C. Heyn, and W. Hansen, Phys. Rev. B 69, 195317 (2004).
G. S. Solomon, J. A. Trezza, A. F. Marshall, and J. S. Harris, Jr., Phys. Rev. Lett. 76, 952 (1996).
C. Pryor, Phys. Rev. Lett. 80, 3579 (1998).
A. F. Tsatsul’nikov, A. Yu. Egorov, A. E. Zhukov, et al., Fiz. Tekh. Poluprovodn. 31, 851 (1997) [Semiconductors 31, 722 (1997)].
A. A. Gutkin, P. N. Brunkov, and S. G. Konnikov, Fiz. Tekh. Poluprovodn. 41, 1353 (2007) [Semiconductors 41, 1335 (2007)].
D. L. Losee, J. Appl. Phys. 46, 2204 (1975).
Author information
Authors and Affiliations
Corresponding author
Additional information
Original Russian Text © A.A. Gutkin, P.N. Brunkov, A.Yu. Egorov, A.E. Zhukov, S.G. Konnikov, 2008, published in Fizika i Tekhnika Poluprovodnikov, 2008, Vol. 42, No. 9, pp. 1122–1125.
Rights and permissions
About this article
Cite this article
Gutkin, A.A., Brunkov, P.N., Egorov, A.Y. et al. Electron emission from multilayer ensembles of vertically coupled InAs quantum dots in an n-GaAs matrix. Semiconductors 42, 1104–1107 (2008). https://doi.org/10.1134/S1063782608090170
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S1063782608090170