Abstract
The effect of the thickness of embedded InAs and GaAs layers on the infrared reflection spectra of lattice vibrations for AlInAs/InAs/AlInAs, InGaAs/GaAs/InGaAs, and AlInAs/InGaAs/GaAs/InGaAs/AlInAs multilayer epitaxial heterostructures grown by MOC hydride epitaxy on InP (100) substrates is studied. Relative stresses emerging in the layers surrounding the embedded layers with variation in the number of monolayers from which the quantum dots are formed and with variation the thickness of the layers themselves surrounding the embedded layers are evaluated.
Similar content being viewed by others
References
A. Madhukar et al., Appl. Phys. Lett. 64, 2727 (1994).
F. Hatami et al., Appl. Phys. Lett. 67, 656 (1995).
D. A. Vinokurov, V. A. Kapitonov, D. N. Nikolaev, et al., Fiz. Tekh. Poluprovodn. 35, 242 (2001) [Semiconductors 35, 235 (2001)].
E. P. Domashevskaya, P. V. Seredin, et al., Surf. Interface Anal. 38, 4 (2006).
Yu. I. Ukhanov, Optical Properties of Semiconductors (Nauka, Moscow, 1977) [in Russian].
W. G. Spitzer, D. Kleiman, and D. Walsh, Phys. Rev. 113, 1 (1959).
H. W. Verleur, J. Opt. Soc. Am. 58, 1356 (1968).
S. P. Kozyrev, Fiz. Tekh. Poluprovodn. 36, 3008 (1994) [Semiconductors 36, 1601 (1994)].
W. A. Harrison, Electronic Structure and the Properties of Solids, Ed. by W. H. Freeman (San Francisco, 1980).
Yu. A. Goldberg, in Handbook Series on Semiconductor Parameters, Ed. by M. Levinshtein, S. Rumyantsev, and M. Shur (World Sci., London, 1999), Vol. 2, p. 1.
Characteristics of New Semiconductor Materials, http://www.ioffe.ru/SVA/NSM/Semi-cond/AlGaAs/basic.html.
U. Pusep et al., Pis’ma Zh. Éksp. Teor. Fiz. 52, 9 (1991).
Author information
Authors and Affiliations
Corresponding author
Additional information
Original Russian Text © P.V. Seredin, É.P. Domashevskaya, A.N. Lukin, I.N. Arsent’ev, D.A. Vinokurov, I.S. Tarasov, 2008, published in Fizika i Tekhnika Poluprovodnikov, 2008, Vol. 42, No. 9, pp. 1072–1078.
Rights and permissions
About this article
Cite this article
Seredin, P.V., Domashevskaya, É.P., Lukin, A.N. et al. Infrared reflection spectra of multilayer epitaxial heterostructures with embedded InAs and GaAs layers. Semiconductors 42, 1055–1061 (2008). https://doi.org/10.1134/S1063782608090108
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S1063782608090108