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X-ray imaging of structural defects in Si1−x Ge x single crystals using a white synchrotron beam

  • Diffraction and Scattering of Ionizing Radiations
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Abstract

Nonmonochromatic (white) synchrotron radiation with a high spatial coherence makes it possible to use different types of interaction of X-rays with matter simultaneously: diffraction, refraction, absorption, and fluorescence. In this case, the structure of materials is studied by the real-time recording of high-resolution images of different types under the same conditions. The use of X-ray images for studying the structural quality is demonstrated by the example of Czochralski-grown Si1 −x Ge x single crystals. The effect that the germanium content has on the formation and evolution of the defect structure is analyzed and the relationship between the structure and properties is investigated. The experiments were performed on the Pohang Light Source (Pohang, Republic of Korea).

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References

  1. T. Tuomi, K. Naukkarinen, and P. Rabe, Phys. Status Solidi A 25, 93 (1974).

    Article  ADS  Google Scholar 

  2. M. Kovalchuk and V. G. Kohn, Mds of Structural Analysis (Izd-vo IK AN SSSR, Moscow, 1989) [in Russian], p. 162.

    Google Scholar 

  3. D. K. Bowen and B. K. Tanner, High Resolution X-Ray Diffractometry and Topography (Taylor and Francis, London, 1998).

    Google Scholar 

  4. A. Snigirev, I. Snigireva, V. Kohn, et al., Rev. Sci. Instrum. 66, 5486 (1995).

    Article  ADS  Google Scholar 

  5. P. Cloetens, R. Barrett, J. Baruchel, et al., J. Phys. D: Appl. Phys. 29, 133 (1996).

    Article  ADS  Google Scholar 

  6. G. Margaritondo and G. Tromba, J. Appl. Phys. 85, 3406 (1999).

    Article  ADS  Google Scholar 

  7. Y. Hwu, H. H. Hsieh, M. J. Lu, et al., J. Appl. Phys. 86, 4613 (1999).

    Article  ADS  Google Scholar 

  8. T. S. Argunova, M. Yu. Gutkin, J. H. Je, et al., J. Mater. Res. 17, 2705 (2002).

    Article  ADS  Google Scholar 

  9. N. Abrosimov, S. Rossolenko, W. Thieme, et al., J. Cryst. Growth 174, 182 (1997).

    Article  ADS  Google Scholar 

  10. R. Smither, K. Abu Saleem, M. Beno, et al., Rev. Sci. Instrum. 76, 123 107 (2005).

    Article  Google Scholar 

  11. N. V. Abrosimov, Exp. Astron. 20, 185 (2005).

    Article  ADS  Google Scholar 

  12. A. Patrin, N. Abrosimov, M. Malin’ski, et al., Solid Energy Mater. Solid C 72, 579 (2002).

    Article  Google Scholar 

  13. P. Gaworzewski, K. Tittelbach-Helmrich, U. Penner, et al., J. Appl. Phys. 83, 5258 (1998).

    Article  ADS  Google Scholar 

  14. I. V. Grekhov, E. I. Belyakova, L. S. Kostina, et al., Tech. Phys. Lett. 34, 1027 (2008).

    Article  ADS  Google Scholar 

  15. D. L. Harame, S. J. Koester, G. Freeman, et al., Appl. Surf. Sci. 224, 9 (2004).

    Article  ADS  Google Scholar 

  16. T. S. Argunova, E. I. Belyakova, I. V. Grekhov, et al., Semiconductors 41, 921 (2007).

    Article  ADS  Google Scholar 

  17. I. V. Grekhov, L. S. Kostina, T. S. Argunova, et al., Semiconductors 44, 1101 (2010).

    Article  ADS  Google Scholar 

  18. T. S. Argunova, V. G. Kon, and J. H. Je, Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, Vol. 2, No. 6, 861 (2008).

    Article  Google Scholar 

  19. J. M. Yi, S. K. Seol, J. H. Je, et al., Nucl. Instrum. Methods Phys. Res., Sect. A 551, 152 (2005).

    Article  ADS  Google Scholar 

  20. A. Lang, J. Phys. D: Appl. Phys. 26, A1 (1993).

    Article  ADS  Google Scholar 

  21. T. S. Argunova, J-W. Jung, J-H. Je, et al., J. Phys. D: Appl. Phys. 42, 085 404 (2009).

    Article  Google Scholar 

  22. http://vkacl.narod.ru

  23. V. G. Kon, T. S. Argunova, and J. H. Je, Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, Vol. 5, No. 1, 1 (2011).

    Article  Google Scholar 

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Authors and Affiliations

  1. Ioffe Physicotechnical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, St. Petersburg, 194021, Russia

    T. S. Argunova, A. G. Zabrodskii & L. M. Sorokin

  2. Institute of Crystal Growth, 12489, Berlin, Germany

    N. V. Abrosimov

  3. Institute of Solid State Physics, Russian Academy of Sciences, Chernogolovka, 142432, Russia

    N. V. Abrosimov

  4. Pohang University of Science and Technology, 790-784, Pohang, Republic of Korea

    J. H. Je

Authors
  1. T. S. Argunova
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  2. A. G. Zabrodskii
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  3. L. M. Sorokin
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  4. N. V. Abrosimov
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  5. J. H. Je
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Corresponding author

Correspondence to T. S. Argunova.

Additional information

Original Russian Text © T.S. Argunova, A.G. Zabrodskii, L.M. Sorokin, N.V. Abrosimov, J.H. Je, 2011, published in Kristallografiya, 2011, Vol. 56, No. 5, pp. 868–875.

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Argunova, T.S., Zabrodskii, A.G., Sorokin, L.M. et al. X-ray imaging of structural defects in Si1−x Ge x single crystals using a white synchrotron beam. Crystallogr. Rep. 56, 811–818 (2011). https://doi.org/10.1134/S1063774511050038

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  • DOI: https://doi.org/10.1134/S1063774511050038

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