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Correction coefficients in X-ray photoelectron spectroscopy

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Abstract

Correction coefficients to the photoemission intensity taking into account the processes of multiple elastic scattering in finite-thickness layers are introduced. The presented procedure is based on a description of X-ray photoelectron spectroscopy signals using solutions to boundary-value problems for the equations of photoelectron transport by means of invariant-embedding methods. Exact numerical and smallangle solutions to the obtained equations are presented. A generalization to the case of description of the photoemission cross section is obtained taking nondipole corrections into account.

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Authors and Affiliations

  1. National Research University “Moscow Power Engineering Institute”, Moscow, 111250, Russia

    P. S. Kaplya & V. P. Afanas’ev

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  1. P. S. Kaplya
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  2. V. P. Afanas’ev
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Correspondence to V. P. Afanas’ev.

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Kaplya, P.S., Afanas’ev, V.P. Correction coefficients in X-ray photoelectron spectroscopy. J. Surf. Investig. 10, 1053–1059 (2016). https://doi.org/10.1134/S1027451016050293

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  • DOI: https://doi.org/10.1134/S1027451016050293

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