Skip to main content

Intrinsic excitation effect for the Al and Mg samples XPS analysis


DIIMFP extraction method based on the numerical solution of electron scattering is presented. DIIMFP data extracted from Reflected Electron Energy Loss Spectra (REELS) is used for Photoelectron spectroscopy (PES) calculations. Experimental data can be described accurately without any intrinsic excitation effect. Authors propose that intrinsic energy losses were introduced to face inaccuracies due to inadequate description of electron energy loss process.

This is a preview of subscription content, access via your institution.


  1. A. Jablonski, F. Salvat, and C. J. Powell, NIST Electron Elastic Scattering Cross Section Database, Version 3.2, Standard Reference Data Program Database No. 64.

  2. F. Ybero and S. Tougaard, Phys. Rev. B 71, 045414 (2005)

    Article  Google Scholar 

  3. C. Biswas, A. K. Shukla, S. Banik, V. K. Ahire, and S. R. Barman, Phys. Rev. B 67, 165416 (2003).

    Article  Google Scholar 

  4. V. P. Afanas’ev and A. V. Lubenchenko, Surf. Invest. 13, 1087 (1998).

    Google Scholar 

  5. V. P. Afanas’ev, A. V. Lubenchenko, and M. K. Gubkin, Europhys. J. B 37, 117 (2004).

    Google Scholar 

  6. V. P. Afanas’ev, D. S. Efremenko, D. A. Ivanov, P. S. Kaplya, and A. V. Lubenchenko, J. Surf. Invest.: X-ray, Synchrotron Neutron Tech. 7, 382 (2012).

    Article  Google Scholar 

  7. V. P. Afanas’ev, P. S. Kaplya, A. V. Lubenchenko, and O. I. Lubenchenko, Vacuum 105, 96 (2014).

    Article  Google Scholar 

  8. M. Trzhaskovskaya, V. Nefedov, and Y. Yarzhemsky, At. Data Nucl. Data Tables 77, 97 (2001).

    Article  Google Scholar 

  9. S. Tougaard and I. Chorkendorff, Phys. Rev. B 35, 6570 (1987).

    Article  Google Scholar 

  10. P. M. Th. M. van Attekum, and J. M. Trooster, Phys. Rev. B 20, 2335 (1979).

    Article  Google Scholar 

  11. C. Wagner, W. Riggs, L. Davis, and J. Moulder, Handbook of X-ray Photoelectron Spectroscopy (Perkin-Elmer Corporation, Phys. Electron. Div., USA, 1992).

    Google Scholar 

Download references

Author information

Authors and Affiliations


Corresponding author

Correspondence to A. S. Gryazev.

Additional information

The article is published in the original.

Rights and permissions

Reprints and Permissions

About this article

Verify currency and authenticity via CrossMark

Cite this article

Afanas’ev, V.P., Gryazev, A.S., Kaplya, P.S. et al. Intrinsic excitation effect for the Al and Mg samples XPS analysis. J. Synch. Investig. 10, 108–112 (2016).

Download citation

  • Received:

  • Published:

  • Issue Date:

  • DOI:


  • XPS
  • PES
  • AES
  • intrinsic excitation
  • invariant imbedding method
  • inelastic electron scattering
  • elastic electron scattering